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Observations of TiO2 Surfaces Using Totally Reflected X-ray In-plane Diffraction Under UV Irradiation

Published online by Cambridge University Press:  11 February 2011

T. Horiuchi ,
H. Ochi ,
K. Kaisei ,
K. Ishida  and
K. Matsushige
T. Horiuchi
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
H. Ochi
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
K. Kaisei
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
K. Ishida
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
K. Matsushige
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
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Abstract

Surface lattice displacements of titanium dioxide (TiO2: rutile) during ultra-violet (UV) light irradiation have been investigated using a total reflection x-ray diffraction, which provides a high signal to noise ratio (S/N) and superior in-plane surface diffraction. Under the environments in vapors of H2O, CH3OH, C2H5OH and C3H6OH, the photo-catalytic activities of TiO2 (110), (100) and (001) surfaces subject to UV irradiation have been measured. It is found that the diffraction peaks and their full width half maxima (FWHMs) show some peculiarities with respect to the photo-catalytic activities in both surface lattices and adsorbed molecules in vapors. Furthermore, Kelvin force microscopy (KFM) has showed that there exists a very high surface potential, probably due to surface atom displacements induced by UV irradiation. With regard to the origin of the photo-catalytic activities, the induced surface potentials are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 751: Symposium Z – Structure-Property Relationships of Oxide Surfaces and Interfaces II , 2002 , Z3.47
Copyright
Copyright © Materials Research Society 2003

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References

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