Hostname: page-component-7dd5485656-wjfd9 Total loading time: 0 Render date: 2025-10-31T23:16:31.724Z Has data issue: false hasContentIssue false
  • English
  • Français

Progress of the Phase-change Optical Disk Memory

Published online by Cambridge University Press:  21 March 2011

Takeo Ohta ,
Noboru Yamada ,
Hiroaki Yamamoto ,
Tsuneo Mitsuyu ,
Takashi Kozaki ,
Jianrong Qiu  and
Kazuyuki Hirao
Takeo Ohta
Affiliation:
Optical disk systems development center Matsushita Electric Industrial Co., Ltd. Kadoma, Kadoma City, 571-8501 Osaka, Japan
Noboru Yamada
Affiliation:
Optical disk systems development center Matsushita Electric Industrial Co., Ltd. Kadoma, Kadoma City, 571-8501 Osaka, Japan
Hiroaki Yamamoto
Affiliation:
Optical disk systems development center Matsushita Electric Industrial Co., Ltd. Kadoma, Kadoma City, 571-8501 Osaka, Japan
Tsuneo Mitsuyu
Affiliation:
The Nakao Laboratory Matsushita Electric Industrial Co., Ltd Yagumo Naka-machi, Moriguchi City, 570-8501 Osaka, Japan
Takashi Kozaki
Affiliation:
Matsushita Techno-Research Matsushita Electric Industrial Co., Ltd Yagumo Naka-machi, Moriguchi City, 570-8501 Osaka, Japan
Jianrong Qiu
Affiliation:
Photon Craft Project, ICORP, JST Keihanna-plaza, Hikaridai, Seika-cho, 619-0237 Kyoto, Japan
Kazuyuki Hirao
Affiliation:
Photon Craft Project, ICORP, JST Keihanna-plaza, Hikaridai, Seika-cho, 619-0237 Kyoto, Japan
Get access

Abstract

Optical memory has two recording modes: the photon-mode as a silver halide photograph and the heat-mode as a laser optical disk. Though laser heat-mode recording has the advantage of environmental stability, it has limitations due to thermal diffusion phenomena, which will be discussed in this paper.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1)Ovshinsky, S. R., Phys. Rev. Lett., 21(1968)p.1450.Google Scholar
2)Feinleib, J., Neufville, J. de, Moss, S.C., Ovshinsky, S. R.: Appl. Phys. Lett., 18(1971)p.122.Google Scholar
3)Terao, M., Nishida, N., Miyauchi, Y., Horigome, S., Kaku, T., Ohta, N.: Proc. SPIE 695, (1986)p.105.Google Scholar
4)Yamada, N., Ohno, E., Akahira, N., Nishiuchi, K., Nagata, K. and Takao, M.,: Proc. Int. Symp. on Optical Memory, (1987)p. 61.Google Scholar
5)Suzuki, M., Doi, I., Nishimura, K., Morimoto, I., Mori, K.: Proc. Optical Memory Symposiup'8(1988)p. 41.Google Scholar
6)Ohta, T., Uchida, M., Yoshioka, K., Inoue, K., Akiyama, T., Furukawa, S.,: Kotera, K., Nakamura, S., Proc. SPIE, Vol. 1078(1989)p. 27.Google Scholar
7)Zhou, G. F., Borg, H. J., Rijpers, J.C.N., Lankhorst, M.: ODS. Tech. Digest (2000) TuB4, p.74.Google Scholar
8)Yamada, N., Ohno, E., Nishiuchi, K., Akahira, N.: J. Appl. Phys., Vol. 69, No. 5 (1991) p.2849.Google Scholar
9)Ohta, T., Inoue, K., Furukawa, S., Akiyama, T., Uchida, M., Nakamura, S.: Electro. & Comun.Technical Research Meeting Rep. CPM89-84(1989)p. 41.Google Scholar
10)Ohta, T., Inoue, K., Furukawa, S., Yoshioka, K., Uchida, M., Nakamura, S.: Electro. & Comun.Technical Research Meeting Rep. CPM90-35(1990)p. 43.Google Scholar
11)Inoue, K., Furukawa, S., Yoshioka, K., Kawahara, K., Ohta, T.: Proc. ASME, Vol.2, (1992)p.593.Google Scholar
12)Ohta, T.: ODS(1991), Tech. Digest, (1991)p.84.Google Scholar
13)1.3GB 90mm Phase-change optical disk, ISO/IEC JTC: Project 1.23.14760(1995).Google Scholar
14)Ohta, T., Inoue, K., Ishida, T., Gotoh, Y. and Satoh, I.,: Jpn. J. Appl. Phys. Vol. 32(1993)p. 5214.Google Scholar
15)Sugaya, T., Taguchi, T., Shimura, K., Taiara, K., Honguh, Y., Satoh, H.,: Jpn. J. Appl. Phys., Vol. 32(1993)p.5402.Google Scholar
16)Aratani, K., Fukumoto, A., Ohta, M., Kaneko, M., Watanabe, K.: Proc. SPIE1499, Optical Data Storage Topical Meeting(1991) p.209.Google Scholar
17)Awano, H., Yamaguchi, A., Shirai, H., Sumi, S., Ohnuki, S., Tazawa, K., Ohta, N.: Appl. Phys. Lett., (1996) p.4257.Google Scholar
18)Shiratori, T., Fujii, E., Miyaoka, Y., Hozumi, Y.: J. Magn. Soc. Jpn. Vol. 22, Supplement No. S2, (1998) p.47.Google Scholar
19)Kai, S., Fukumoto, A., Aratani, K., Yoshimura, S., Tsutsui, K., Arai, M., Takeshita, Y.: 0 Technical Digest, ISOM/ODS'99, TuA4(1999)p. 75.Google Scholar
20)Kurokawa, K., Nito, M., Yasuda, K., Kashiwagi, T., Kawakubo, O.: Technical Digest, ISOM/ODS'99, (1999)p. 197.Google Scholar
21)Nagata, K., Nishiuchi, K., Furukawa, S., Yamada, N., Akahira, N.:Jpn. J. Appl. Phys. Vol. 38(1999)p.1679.Google Scholar
22)Akiyama, T., Uno, M., Kitaura, H., Narumi, K., Nishiuchi, K., Yamada, N.,: We-C-01, Tech. Digest ISOM2000, (2000) p.16.Google Scholar
23)Ovshinsky, S. R.: Proc. The 9th Symp. on Phase Change Recording(1997)p. 44.Google Scholar
24)O'Neill, M. P., Wong, T. L.: ODS. Tech. Digest (2000) WB2, p.170.Google Scholar
25)Ohta, T., Nishiuchi, K., Narumi, K., Kitaoka, Y., Ishibashi, H., Yamada, N., Kozaki, T.: Jpn. J. Appl. Phys. Vol. 39(2000)p. 770.Google Scholar
26)Fuji, H., Tominaga, J., Nakao, T., Atohda, N., Katayama, H.: Technical Digest, ISOM/ODS'99, TuD29(1999).Google Scholar
27)Kishima, K., Ichihara, I., Yamamoto, K., Osato, K., Kuroda, Y., Iida, A., Saito, K.: Technical Digest, ODS2000, (2000), MC2, p.33.Google Scholar
28)Miura, K., Qie, J., Inoue, H., Mitsuyu, T., Hirao, K.: Appl. Phys. Lett. 71 (1997)p.3329.Google Scholar
29)Hohlfeld, J., Gerrits, Th., Bilderbeek, M., Awano, H., Ohta, N., Rasing, Th.: J. Magn. Soc. Japan, Vol. 25, No.3-2,(2001) p.202.Google Scholar