Hostname: page-component-cb9f654ff-nr592 Total loading time: 0 Render date: 2025-08-03T09:55:22.153Z Has data issue: false hasContentIssue false
  • English
  • Français

Response Time Measurements and Flying Spot Technique in Microcrystalline Silicon Solar Cells

Published online by Cambridge University Press:  17 March 2011

R. Schwarz ,
P. Sanguino ,
S. Koynov ,
M. Fernandes ,
F. Maçarico ,
P. Louro  and
M. Vieira
R. Schwarz
Affiliation:
Physics Department, Instituto Superior Técnico, IST, P-1096 Lisboa, Portugal Electronics and Communications Department, Instituto Superior de Engenharia de Lisboa, ISEL, P-1940-014 Lisboa, Portugal Tel: +351-21-841 7775, e-mail: rschwarz@fisica.ist.utl.pt
P. Sanguino
Affiliation:
Physics Department, Instituto Superior Técnico, IST, P-1096 Lisboa, Portugal
S. Koynov
Affiliation:
Physics Department, Instituto Superior Técnico, IST, P-1096 Lisboa, Portugal
M. Fernandes
Affiliation:
Electronics and Communications Department, Instituto Superior de Engenharia de Lisboa, ISEL, P-1940-014 Lisboa, Portugal
F. Maçarico
Affiliation:
Electronics and Communications Department, Instituto Superior de Engenharia de Lisboa, ISEL, P-1940-014 Lisboa, Portugal
P. Louro
Affiliation:
Electronics and Communications Department, Instituto Superior de Engenharia de Lisboa, ISEL, P-1940-014 Lisboa, Portugal
M. Vieira
Affiliation:
Electronics and Communications Department, Instituto Superior de Engenharia de Lisboa, ISEL, P-1940-014 Lisboa, Portugal
Get access

Abstract

Transverse charge collection in a p-i-n structure based on microcrystalline silicon and lateral transport in a single intrinsic layer were analyzed using transient photoconductivity (TPC), steady-state photocarrier grating analysis (SSPG), and the flying spot technique (FST). Photocurrents were excited either with HeNe laser light (633 nm, intensity about 20 mW/cm2) or with 5 ns pulses from a Nd:YAG laser (532 nm, peak power of about 500 kW/cm2 with 5 mJ pulses). The response time τR varied greatly from about 3 ms at low intensity down to a few μs under pulsed laser excitation. The minority carrier diffusion length L D measured by FST in diode structures was usually larger than values obtained from the SSPG method applied to intrinsic microcrystalline layers.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 609: Symposium A – Amorphous & Heterogeneous Silicon Thin Films – 2000 , 2000 , A32.4
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Rose, A., Concepts in Photoconductivity and Allied Problems (Wiley Interscience, New York, 1963).Google Scholar
[2] Wang, F. and Schwarz, R., Phys. Rev. B52 (1995) 14586 Google Scholar
[3] Ritter, D., Zeldov, E., and Weiser, K., Appl. Phys. Lett. 49 (1986) 791 Google Scholar
[4] Adam, G., Physica XX, No. 11 (1954) 1037 Google Scholar
[5] Vieira, M., PhD thesis, Universidade Nova de Lisboa, Lisbon, 1994, unpublished.Google Scholar
[6] Vieira, M., Fantoni, A., Martins, R., Chu, V., Koynov, S., Wang, F., Grebner, S., and Schwarz, R., Proc. of the 1st World Conf. on Photovoltaic Energy Conversion (WCPEC-1), Hawaii, December 1994.Google Scholar
[7] Meier, J., Flueckiger, F., Keppner, H., Shah, A.V., Appl. Phys. Lett. 65 (1994) 860 Google Scholar
[8] Sanguino, P., Koynov, S., Schwarz, R., Fernandes, M., Vieira, M., Manso, R., Joyce, A., and Collares-Perreira, M., Mat. Res. Soc. Symp. Proc. 557 (1999) 597 Google Scholar
[9] Meiling, H. and Schropp, R.E.I., Appl. Phys. Lett. 69 (1996) 1062 Google Scholar
[10] Vieira, M. et al. , this conference.Google Scholar
[11] Koynov, S., Grebner, S., Radojkovic, P., Hartmann, E., Schwarz, R., Vasilev, L., Krankenhagen, R., Sieber, I., Henrion, W., and Schmidt, M., J. Non-Cryst. Sol. 198–200 (1996) 1012 Google Scholar
[12] Vieira, M., Koynov, S., Fantoni, A., Schwarz, R., Thin Solid Films 296 (1997) 164 Google Scholar
[13] Schwarz, R., Múrias, T., Conde, J.P., Brogueira, P., and Chu, V., Mat. Res. Soc. Symp. Proc. 507 (1997) 193 Google Scholar
[14] Vieira, M., Maçarico, F., Fernandes, M., Koynov, S., and Schwarz, R., Proc. of CYTED, Havana, Cuba, November 13-15, 1998.Google Scholar
[15] Fantoni, A., PhD thesis, Universidade Nova de Lisboa, Lisbon, 1999, unpublished.Google Scholar