Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Chen, Wei-Ming
Banerjee, Sanjay K.
and
Lee, Jack C.
1994.
Degradation mechanisms and improvement of thermal stability of CoSi2/polycrystalline Si layers.
Applied Physics Letters,
Vol. 64,
Issue. 12,
p.
1505.
Maex, K.
1996.
Advances in Rapid Thermal and Integrated Processing.
p.
333.
Peng, Chien-Hsiung
Maa, Jer-shen
and
Teng Hsu, Sheng
1997.
Edge leakage of cobalt silicided shallow junctions.
Thin Solid Films,
Vol. 308-309,
Issue. ,
p.
575.
Tung, R.T.
2001.
Encyclopedia of Materials: Science and Technology.
p.
8249.