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Stebic Revisited

Published online by Cambridge University Press:  21 February 2011

Paul D. Brown
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK.
Colin J. Humphreys
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK.
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Abstract

We re-examine the technique of Scanning Transmission Electron Beam Induced Conductivity and report on the acquisition of remote contact EBIC images at 200keV showing variations in electrical activity within P-doped CdTe.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

1 Wilson, P.R., Ultramicroscopy 31 177 (1989)Google Scholar
2 Lavel, J.Y., Pinet-Berger, M.H. and Cabanel, C., J. de Phys. Colloque C5 521 (1988)Google Scholar
3 Bubulac, L.O. and Tennant, W.E., Appl. Phys. Lett 52 1255 (1988)CrossRefGoogle Scholar
4 Panin, G.N. and Yakimov, EB., Inst. Phys. Conf. Ser. No. 177 763 (1991); Panin, G.N. and Yakimov, EB., J. de Phys Ç6 181 (1991)Google Scholar
5 Russell, G.J., Robertson, M.J., Vincent, B. and Woods, J., J. Mat. Sei. 15 939 (1980)CrossRefGoogle Scholar
6 Leamy, HJ., J. Appl. Phys. 53 R51 (1982)CrossRefGoogle Scholar
7 2nd and 3rd International workshops on beam injection assessment of defects in semiconductors, in J. de Phys. Vol.1 Colloque No 6 Suppl JPIII No 12 (1991) and Mat. Sei. Eng. B24 (1994) respectively.Google Scholar
8 Sparrow, T.G. and Valdré, U., Phil. Mag. 36 1517 (1977)CrossRefGoogle Scholar
9 Fathy, D., Sparrow, T.G. and Valdré, U., J. Microsc. 118 263 (1979)CrossRefGoogle Scholar
10 Fathy, D. and Valdré, U., J. Microsc. Spectrosc. 5 175 (1980)Google Scholar
11 Petroff, P.M., Lang, D.V., Strudel, J.L. and Logan, R.A., Scanning Electron Microscopy 1 325 (1978)Google Scholar
12 Petroff, P.M., Logan, R.A. and Savage, A., Phys. Rev. Lett. 44 287 (1980)CrossRefGoogle Scholar
13 Pennycook, S.J., Ultramicroscopy 7 99 (1981)CrossRefGoogle Scholar
14 Ourmazd, A. and Booker, G.R, phys stat sol (a) 55 771 (1979); /A. Ourmazd, Cryst. Res. Technol. 16 137(1981)CrossRefGoogle Scholar
15 Perreault, G.C., Hyland, S.L. and Ast, D.G., Solar Energy Materials and Solar Cells 30 309 (1993)CrossRefGoogle Scholar
16 Hyland, S., Perrault, G., Wohlgemuth, J. and Ast, D.G., J. Crystal Growth 104 175 (1990)CrossRefGoogle Scholar
17 Perreault, G.C. and Ast, D.G., J. Phys. E Sei. Instrum. 21 1175 (1988)CrossRefGoogle Scholar
18 Cabanel, C. and Lavel, J.Y., J. Appl. Phys. 67 1425 (1990)CrossRefGoogle Scholar
20 Donolato, C., Inst Phys Conf Ser. No. 60 215 (1981); Donolato, C., phys. stat sol. (a) 65.649 (1981)Google Scholar
21 Alnajarr, A.A., Watson, C.C.R., Brinkman, A.W. and Duróse, K., J. Crystal Growth 117 385 (1992)CrossRefGoogle Scholar
22 Loginov, Y.Y., Brown, P.D., Thompson, N., Alnajjar, A.A., Brinkman, A.W. and Woods, J., J. Crystal Growth 117 259 (1991)CrossRefGoogle Scholar
23 Donolato, C., J. Phys. D 101 781 (1977)Google Scholar
24 Palm, J. and Alexander, H., J. de Phys. C6 101 (1991)Google Scholar
25 Benabbas, T. and Lavel, J.Y., J. de Phys. C6 231 (1991)Google Scholar

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