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An Optical Gap Calibration Applied to the Case of Hydrogenated Amorphous Silicon

Published online by Cambridge University Press:  15 February 2011

D. E. Sweenor ,
S. K. O'Leary  and
B. E. Foutz
D. E. Sweenor
Affiliation:
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180-3590
S. K. O'Leary
Affiliation:
Faculty of Engineering, University of Regina, Regina, Saskatchewan, Canada 54S 0A2
B. E. Foutz
Affiliation:
School of Electrical Engineering, Cornell University, Ithaca, New York 14853
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Abstract

There are many different empirical means whereby the optical gap of an amorphous semiconductor may be defined. We analyze some hydrogenated amorphous silicon data with respect to a number of these empirical measures for the optical gap. By plotting these various gap measures as a function of the breadth of the optical absorption tail, we provide a means of relating these disparate measures of the optical gap. The applicability of this calibration to another set of hydrogenated amorphous silicon data is investigated.

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References

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