Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-16T11:30:55.855Z Has data issue: false hasContentIssue false

Analysis of Cr-Doped CdGeAs2 Using Thermal Admittance Spectroscopy

Published online by Cambridge University Press:  10 February 2011

S.R. Smith
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707 University of Dayton Research Institute, 300 College Park, Dayton, Ohio 45469-0178
A.O. Evwaraye
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707 University of Dayton Physics Department, 300 College Park, Dayton, OH 45469-2314
M.C. Ohmer
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707
A. W. Saxler
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707
J. T. Goldstein
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707
J. Solomona
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707 University of Dayton Research Institute, 300 College Park, Dayton, Ohio 45469-0178
P. G. Schunemann
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707 Sanders, A Lockheed Martin Company, Nashua NH 03061-2035
T. M. Pollak
Affiliation:
Air Force Research Laboratory, AFRLIMLPO, Wright-Patterson Air Force Base, Ohio 45433-7707 Sanders, A Lockheed Martin Company, Nashua NH 03061-2035
Get access

Abstract

The optical and electrical properties of chrome-doped CdGeAs2 (CGA), an important non-linear optical material, are reported. CGA, a chalcopyrite semiconductor of the pseudo- III-V type, is a close ternary analog to GaAs, possessing significant differences. To date, the electrical and optical properties of as-grown undoped CGA have been controlled by a somewhat shallow dominant residual acceptor which it is the source of significant undesirable optical absorption. Highly transparent semi-insulating CGA should be attainable using compensation and counterdoping schemes similar to those used for GaAs. However, identifying suitable deep and shallow n-type and p-type dopants will require extensive empirical studies. As a starting point of survey to find deep levels, the properties of CGA:Cr have been investigated. Cr is a reasonable choice as it has been used extensively to provide a deep level in GaAs. Thermal Admittance Spectroscopy was used to examine the electrically active levels in this material. These measurements were correlated with temperature dependent Hall effect measurements, and IR absorption measurements. SIMS analysis was utilized to estimate the Cr concentration as the segregation coefficient for Cr in CGA has not been reported.. The results show that there is a p-type level introduced into the band gap at about 0.16 eV above the valence band, a value nominally 50% deeper than that of the native acceptor. The background doping as measured by Capacitance-Voltage measurements was determined to be 8 × 1016 cm−3 near the surface, and 1.0 × 1017 cm−3 in the bulk. These results are compared to similar measurements in undoped material.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Zwieback, I, Perlov, D., Maffetone, J.P., and Ruderman, W., Appl. Phys. Lett. 73, 2185 (1998) And references therein.Google Scholar
2. Bairamov, B.H., Rud, V.Yu., and Rud, Yu.V., Materials Res. Soc. Bull. 23, 41 (1998).Google Scholar
3. Dmitriev, V.G., Gurzadayan, G.G. and Nikogosyan, D.N., Handbook of Nonlinear Optical Crystals (Springer, New York, 1997).Google Scholar
4. Schunemann, P.G., and Pollack, T.M., J. of Crystal Growth 174, 272 (1997).Google Scholar
5. Pandey, Ravindra, Ohmer, Melvin C., and Gale, Julian, J. Phys.: Condens. Matter 10, 5525 (1998).Google Scholar
6. Borshchevskii, A.S., Goryunova, N.A., Osmanov, E.O., Polushina, I.K., Royenko, N.D., and Smirnova, A.D., Mater. Sci. Eng. 3, 118 (1968-1969).Google Scholar
7. Caldas, M.J., Fazzio, A., and Zunger, Alex, Appl. Phys. Lett. 45, 671 (1984).Google Scholar
8. Losee, D.L., J. Appl. Phys. 46, 2204 (1975).Google Scholar
9. Vincent, G., Bois, D., and Pinard, P., J. Appl. Phys. 46, 5173 (1975).Google Scholar
10. Evwaraye, A.O., Smith, S.R., and Mitchel, W.C., J. Appl. Phys. 75, 3472 (1994).Google Scholar