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Analysis of Strain Relaxation in Au/Ni Multilayers by X-Ray Diffraction

Published online by Cambridge University Press:  28 February 2011

J. Chaudhuri ,
V. Gondhalekar ,
S. Shah  and
A.F. Jankowski
J. Chaudhuri
Affiliation:
The Wichita State University, Inst. for Aviation Research, Wichita, KS 67208
V. Gondhalekar
Affiliation:
The Wichita State University, Inst. for Aviation Research, Wichita, KS 67208
S. Shah
Affiliation:
The Wichita State University, Inst. for Aviation Research, Wichita, KS 67208
A.F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
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Abstract

The strain distribution within individual layers in Au/Ni multilayer systems was obtained by an iterative fitting of the experimental x-ray diffraction pattern with a kinematic model. The depth profile of strain in the modulation direction was obtained for these metallic multilayers with repeat periodicities ranging from 1.19 nm to 4.26 nm. It was found that the role of interfacial coherency and strengthening is of great importance in understanding the origin of the supermodulus effect in metallic multilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 160 , 1989 , 195
Copyright
Copyright © Materials Research Society 1990

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