Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-23T18:59:47.301Z Has data issue: false hasContentIssue false

Analytical Electron Microscopy Studies of Bi-Substituted Garnet Films

Published online by Cambridge University Press:  15 February 2011

P. A. Crozier
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287-1704
P. A. Labun
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287-1704
T Suzuki
Affiliation:
IBM Almaden Research Center, 650 Harry Rd, San Jose, CA 95120-6099
Get access

Abstract

In-situ heating in an electron microscope, together with EDX and EELS analysis, was used to characterize as-deposited amorphous and transformed garnet films. It was found that upon initial crystallization, a non-uniform precipitation of a second phase occurred, altering the local chemistry and microstructure of the transformed film. In addition, to study the transformation kinetics in more detail some experiments were conducted at slower heating rates and lower temperatures. It is hoped that the data obtained can be correlated to magnetic property measurements and contribute to the development of improved processing conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gomi, M., Utsugi, K. and Abe, M, IEEE Trans. Mag-22, 1233 (1986).Google Scholar
2. Itoh, A., Toriumi, Y., Ishii, T., Nakada, M., Inoue, F. and Kawanishi, K., IEEE Trans. Mag-23, 2964 (1987).CrossRefGoogle Scholar
3. Shono, K., Kano, H., Koshin, N. and Ogawa, S., IEEE Trans. Mag. 23, 2970 (1987).Google Scholar
4. Suzuki, T., Do, H., Sequeda, F., Huang, T. and Gorman, G., Proceeding of MMM (Nov. 1989, Boston) #AA-10.Google Scholar
5. Suzuki, T, Sequeda, F., Do, H., Huang, T. C. and Gorman, G, J. Appl. Phys. 67 (1990) 4435.Google Scholar
6. Suzuki, T., Zaharchuk, G., Gorman, G., Sequeda, F. and Labun, P., IEEE Trans. Mag. 26, 1927 (1990).Google Scholar