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Atom-Probe Microanalysis of Metallic Nanostructured Materials

Published online by Cambridge University Press:  25 February 2011

Ross A.D. Mackenzie ,
Alfred Cerezo ,
James S. Conyers ,
Amanda K. Petford-Long ,
Sybren J. Subrandu  and
George D. W. Smith
Ross A.D. Mackenzie
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Alfred Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
James S. Conyers
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Amanda K. Petford-Long
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Sybren J. Subrandu
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
George D. W. Smith
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
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Abstract

Atom-probe techniques have been used to characterise nanostructured metallic materials prepared by thermal evaporation and by sputtering. Multilayer samples of Fe-Cr have been prepared by sputter deposition and analysed using the Oxford position-sensitive atom probe. This has made it possible to observe the quality of interfaces in the material, and also accurately determine local compositions at each layer within the multilayer stack. Preliminary experiments aimed at producing dual phase nanocrystalline films by thermal evaporator deposition are also reported.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 286: Symposium J – Nanophase and Nanocomposite Materials , 1992 , 167
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Petroff, P.M., Inst. Phys. Conf. Ser. 87, 187 (1987).Google Scholar
2. Dobson, P.J., Proceedings of Int. Conf. on Solid State Science and Technology, August 1992 Penang, Malaysia (in press)Google Scholar
3. Synthetic Modulated Structures, ed. Chang, L.L. and Giessen, B.C., published Academic Press, New York (1986)Google Scholar
4. Zeper, W.B., Greidanus, F.J.A.M., Carcia, P.F. and Fincher, C.R., J.Appl.Phys. 65 4971(1989)Google Scholar
5. Herr, U., Mat. Res. Symp. Proc. 206, 533 (1991).Google Scholar
6. Miller, M.K. and Smith, G.D.W., Atom Probe Microanalysis: Principles and Applications to Materials Problems, published Materials Research Society, 1989 Google Scholar
7. Cerezo, A., Godfrey, T.J., Grovenor, C.R.M., Hetherington, M.G., Hoyle, R.M., Jakubovics, J.P., Liddle, J.A., Smith, G.D.W. and Worrall, G.M., J. Microscopy 154, 215 (1989).Google Scholar
8. Liddle, J.A., Long, N.J. and Petford-Long, A.K., Mater. Char, 25, 157 (1990).Google Scholar
9. Setna, R.P., Hyde, J.M., Cerezo, A., Smith, G.D.W. and Chisholm, M.F., Surf.Sci.(in press).Google Scholar
10. Cerezo, A. and Hetherington, M.G., J. de Phys. Colloq. 50 C8–523 (1989).Google Scholar
11. Mackenzie, R.A.D., Cerezo, A. and Smith, G.D.W., presented at First International Conference on Nanostructured Materials, submitted to Nanostructured Materials.Google Scholar