Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-25T22:03:55.237Z Has data issue: false hasContentIssue false

Biased Deposition of Nanocrystalline Be1−xCux Coatings

Published online by Cambridge University Press:  14 March 2011

A. Jankowski*
Affiliation:
Chemistry and Materials Science, Lawrence Livermore National Laboratory Livermore, CA 94551-9900
Get access

Abstract

Coatings of Be1−xCux are prepared by magnetron sputter deposition onto spherical polymer mandrels. The application of an applied bias during deposition refines the columnar morphology of the coating and surface finish to the nanoscale. A mechanical testing technique is developed to load the thin-walled spherical capsules under uniaxial tension at constant strain to fracture. The bias-deposited material exhibits an increase in strength by a factor of three or more following a Hall-Petch type relationship with surface roughness.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Haan, S., Phys. Plasmas 2, p. 2480 (1995).Google Scholar
2. Adams, R. and Nordin, C., Thin Solid Films 181, p. 375 (1989).Google Scholar
3. Tanner, L., and Ray, R., Acta Metall. 27, p. 1727 (1979).Google Scholar
4. Tanner, L., Scripta Metall. 145, p. 657 (1980).Google Scholar
5. Severin, C., Chen, C., Belova, A., and Lin, M., J. Appl. Phys. 52, p. 1850 (1981).Google Scholar
6. Chen, C.W., and Alford, C.S., J. Vac. Sci. Technol., A6, p. 128 (1988).Google Scholar
7. McEachern, R., Alford, C., Cook, R., Makowiecki, D., and Wallace, R., Fusion Technology 31, p. 4354 (1997).Google Scholar
8. McEachern, R. and Alford, C., Fusion Technology 35, p. 115 (1999).Google Scholar
9. Jankowski, A., Ramsey, P., McKernan, M. and Morse, J., in Amorphous and Nanostructured Carbon, edited by Sullivan, J., Robertson, J., Zhou, O., Allen, T., and Coll, B., (Mater. Res. Soc. Proc. 593, Pittsburgh, PA, 2000), pp. 489492.Google Scholar