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Characterization of Conductive Anodic Filament (Caf) by X-Ray Microtomography and by Serial Sectioning

  • S. R. Stock (a1), L. L. Dollar (a2), G. B. Freeman (a3), W. J. Ready (a1), L. J. Turbini (a1), J. C. Elliott (a1), P. Anderson (a4) and G. R. Davis (a1)...
Abstract
ABSTRACT

X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CAFs) had grown, Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

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MRS Online Proceedings Library (OPL)
  • ISSN: -
  • EISSN: 1946-4274
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