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Characterization of Heat Propagation along Single Tin Dioxide Nanobelt Using the Thermoreflectance Method

Published online by Cambridge University Press:  01 February 2011

Xi Wang ,
Younes Ezzahri ,
James Christofferson ,
Yi Zhang ,
Ali Shakouri ,
Li Shi ,
Choongho Yu  and
Zhong Lin Wang
Xi Wang
Affiliation:
wangxi@soe.ucsc.edu, University of California Santa Cruz, Electrical Engineering, 1156 High Street, Santa Cruz, CA, 95064, United States, 1-831-459-1292
Younes Ezzahri
Affiliation:
younes@soe.ucsc.edu, University of California Santa Cruz, Electrical Engineering, 1156 High Street, Santa Cruz, CA, 95064, United States
James Christofferson
Affiliation:
jchrist@soe.ucsc.edu, University of California Santa Cruz, Electrical Engineering, 1156 High Street, Santa Cruz, CA, 95064, United States
Yi Zhang
Affiliation:
yizhang@soe.ucsc.edu, University of California Santa Cruz, Electrical Engineering, 1156 High Street, Santa Cruz, CA, 95064, United States
Ali Shakouri
Affiliation:
ali@soe.ucsc.edu, University of California Santa Cruz, Electrical Engineering, 1156 High Street, Santa Cruz, CA, 95064, United States
Li Shi
Affiliation:
lishi@mail.utexas.edu, University of Texas Austin, Mechanical Engineering, 1 University Station, Austin, TX, 78712, United States
Choongho Yu
Affiliation:
cyu@lbl.gov, Lawrence Berkeley National Laboratory, Materials Sciences Division, 1 Cyclotron Road, Berkeley, CA, 94720, United States
Zhong Lin Wang
Affiliation:
zhong.wang@mse.gatech.edu, Georgia Institute of Technology, School of Materials Science and Engineering, 225 North Avenue, Atlanta, GA, 30332, United States
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Abstract

In this paper, we studied heat transfer properties of a 230nm wide，450nm thick and 5.4 m long single tin dioxide nanobelt using non-contacted high resolution thermoreflectance imaging technique. Temperature difference across the nanobelt was created by attaching its both ends to a microfabricated thin film heater and sensor pair. High resolution thermal images of the nanobelt and thin film devices were obtained at variant pulsing current amplitudes and frequencies, which allowed us to study the inherent thermal conductance of the nanobelt. Thermal expansion induced thermoreflectance coefficient change is also discussed in this paper.

Keywords

nanostructurethermal conductivityelectronic material
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1022: Symposium II – Nanoscale Heat Transport–From Fundamentals to Devices , 2007 , 1022-II05-05
Copyright
Copyright © Materials Research Society 2007

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