Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-19T03:16:38.941Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of High Temperature Superconducting Thin Film Grown by Laser Ablation Method

Published online by Cambridge University Press:  28 February 2011

K. Shimizu ,
H. Nobumasa ,
N. Nagai ,
T. Matsunobe  and
T. Kawai
K. Shimizu
Affiliation:
Toray Ind. Inc., 2–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
H. Nobumasa
Affiliation:
Toray Ind. Inc., 2–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
N. Nagai
Affiliation:
Toray Research Center Inc., 1-–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
T. Matsunobe
Affiliation:
Toray Research Center Inc., 1-–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
T. Kawai
Affiliation:
Osaka University, Ibaraki, Osaka 567, Japan
Get access

Abstract

We have measured the complex dielectric function of BizSr2Ca1Cu2Ox samples in the near infrared region directly by spectroellipsometry. As for both single crystal and thin film, superconducting samples have a zero point in the real part (ε1) of the complex dielectric function (ε*) and a clear peak of the imaginary part of the inverse ε* at almost the same frequency. On the other hand, non-superconducting samples have no such ei zero point, and the peak height of (-Im(1/ε*)) becomes small. Then we can determine the superconductivity of samples by this spectroellipsometry measurement at room temperature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 861
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Bozovic, I., Phys. Rev. B42, 1969(1990).CrossRefGoogle Scholar
[2] Tajima, S., Uchida, S., Ishii, H., Takagi, H., and Tanaka, S., Modern Phys. Lett. 1, 353(1988).Google Scholar
[3] Schlesinger, Z., Collins, R.T., Kriser, D.L., and Holzerg, F., Phys. Rev. Lett. 59, 1958(1987).Google Scholar
[4] Thomas, G.A., Orenstein, J., Rapkine, D.H., Capizzi, M., Millis, A.J., Bhatt, R.N., Schneemeyer, L.F., and Waszczak, J.V., Phys. Rev. Lett. 61, 1313 (1988).Google Scholar
[5] Etemad, S., Aspnes, D.E., Kelly, M.K., Thompson, R., Tarascon, J.M., and Hull, G.W., Phys. Rev. B37, 3396 (1988).CrossRefGoogle Scholar
[6] Shimizu, K., Nobumasa, H., Nagai, N., and Kawai, T.. in proceedings of M2 S-HTSCI (1991).Google Scholar