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Characterization of Thin Films by Internal Friction Measurements
Published online by Cambridge University Press: 22 February 2011
Abstract
ABSTRACT: Internal friction has been employed to characterize various properties of thin Al and Al-alloy films. The grain boundary relaxation peak was used
a) to determine the activation energies for grain boundary diffusion in the alloy films,
b) to investigate the influence of impurities on the grain boundary diffusion in Al at concentration levels as low as 300 ppm, and
c) to get information about the adhesion strength between the film and the substrate.
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- Research Article
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- Copyright © Materials Research Society 1992
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