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Chemical Structure of MEH-PPV/LiF/Al Interface

Published online by Cambridge University Press:  11 February 2011

X. D. Feng ,
D. Grozea  and
Z. H. Lu
X. D. Feng
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, Ontario, M5S 3E4, Canada
D. Grozea
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, Ontario, M5S 3E4, Canada
Z. H. Lu
Affiliation:
Department of Materials Science and Engineering, University of Toronto, Toronto, Ontario, M5S 3E4, Canada
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Abstract

We studied the poly [2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV)/LiF/Al interface by angle-dependent X-ray photoemission spectroscopy (XPS). The changes in the C1s, O 1s, Al 2p core level spectra, and the evolution of O to C and Li to F atomic ratios at different photoelectron take-off angles were carefully analyzed. A reduced oxygen concentration with a LiF layer at the interface suggests that LiF can help reduce the oxidation of Al. The interface was found rich in Li+ ions, some of which might be attached to MEH-PPV to form “N type” doping. The electron injection layer consists of Li+doped MEH-PPV, LiF, Al oxides, and metallic Al.

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