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Chemical Vapor Deposition of SiO2 from Ozone-Organosilane Mixtures near Atmospheric Pressure

Published online by Cambridge University Press:  22 February 2011

K. V. Guinn
Affiliation:
AT&T Bell Laboratories, Murray Hill, N.J. 07974
J. A. Mucha
Affiliation:
AT&T Bell Laboratories, Murray Hill, N.J. 07974
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Abstract

The kinetics of deposition of SiO2 by the reaction of tetramethylsilane (TMS) with ozone (O3) has been studied over the temperature range 180 – 380° C and compared with available data for the same process using tetraethoxysilane (TEOS). Both processes exhibit the same activation energy (17 kcal/mole) below 300 ° C which falls-off at higher temperatures due to transport limitations. Transition from first- to zero-order kinetics occurs with increasing concentrations of TMS and O3, which gives an overall O3/TMS consumption ratio of 10 at 258° C and5 at 325° C. TEOS is estimated to be 5 times more reactive than TMS above 300° C and over 10 times more reactive in the kinetically-limited regime below 300° C. Results suggest that O3-induced SiO2 deposition proceeds via surface reactions and is limited by heterogeneous decomposition of ozone.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

[l] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 137, 2883 (1990).Google Scholar
[2] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 139, 2282 (1992).Google Scholar
[3] Nguyen, B.. Applied Materials Corp., private communication (1992).Google Scholar
[4] Benson, S. W. and Axworthy, A. E. Jr, J. Chem. Phys., 26, 1718 (1957).Google Scholar
[5] Hertl, W. and Hair, M. L., J. Phys. Chem., 72, 4676 (1968).Google Scholar
[6] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 138, 3019 (1991).Google Scholar