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Complementary Microscopy Platform for Investigations of Hybrid Nanostructures Comprising Quantum Dots and Plasmonic Particles

Published online by Cambridge University Press:  11 February 2015

Katja Dopf ,
Patrick M. Schwab ,
Carola Moosmann ,
Anne Habermehl ,
Uli Lemmer  and
Hans-Juergen Eisler
Katja Dopf
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany
Patrick M. Schwab
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany
Carola Moosmann
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany
Anne Habermehl
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany
Uli Lemmer
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany
Hans-Juergen Eisler
Affiliation:
Light Technology Institute, Karlsruhe Institute of Technology, Karlsruhe, Germany
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Abstract

Nanoscale systems combining colloidal quantum dots with plasmonic antennas will pioneer the development of novel nanodevices with tailored optical features for a wide range of applications. The interactions between such nanoparticles strongly depend on the particular distance. We propose the use of an atomic force microscope (AFM) to image and to position quantum dots with respect to plasmonic particles. Additionally, we analyze the arrangements with several optical characterization methods, such as confocal microscopy, fluorescence microscopy and superresolution optical fluctuation imaging (SOFI). These methods support each other and improve the AFM manipulation technique. The AFM tip is perfectly aligned to a focused laser by detecting the Raman signal of the silicon tip. Thus ultimately, we can simultaneously use the topography information with a spatial resolution in the range of the nanoparticle sizes and cross-correlate it with the optical characterization methods.

Keywords

nanoscalenanostructureoptical
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1748: Symposium II – Semiconductor Nanocrystals, Plasmonic Metal Nanoparticles, and Metal-Hybrid Structures , 2015 , mrsf14-1748-ii05-16
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Curto, A. G., Taminiau, T. H., Volpe, G., Kreuzer, M. P., Quidant, R., and van Hulst, N. F., Nature communications 4, 1750 (2013).CrossRefGoogle Scholar
Marinica, C., Lourenҫo-Martins, H., Aizpurua, J., and Borisov, A. G., Nano Lett. 13(12), 5972–5978 (2013).CrossRefGoogle Scholar
Artuso, R. D., and Bryant, G. W., Phys. Rev. B 87, 125423 (2013).CrossRefGoogle Scholar
Ureña, E. B., Kreuzer, M. P., Itzhakov, S., Rigneault, H., Quidant, R., Oron, D., and Wenger, J., Adv. Mater. 24, 314–320 (2012).CrossRefGoogle Scholar
Curto, A. G., Volpe, G., Taminiau, T. H., Kreuzer, M. P., Quidant, R., and van Hulst, N. F., Science 329, 930–933 (2010).CrossRefGoogle Scholar
Farahani, J. N., Pohl, D. W., Eisler, H.-J., and Hecht, B., Phys. Rev. Lett. 95, 017402 (2005).CrossRefGoogle Scholar
Turner, R. D., Hurd, A. F., Cadby, A., Hobbs, J. K., and Foster, S. J.. Nature communications 4, 1496 (2013).CrossRefGoogle Scholar
Harke, B., Chacko, J. V., Haschke, H., Canale, C., and Diaspro, A., Optical Nanoscopy 1(1), 3 (2012).CrossRefGoogle Scholar
Chacko, J. V., Canale, C., Harke, B., and Diaspro, A., PloS one 8(6), e66608 (2013).CrossRefGoogle Scholar
Wissert, M. D., Schell, A. W., Ilin, K. S., Siegel, M., and Eisler, H.-J., Nanotechnology 20(42), 425203 (2009).CrossRefGoogle Scholar
Dertinger, T., Colyer, R., Iyer, G., Weiss, S., and Enderlein, J., Proceedings of the National Academy of Sciences of the United States of America 106(52), 22287–92 (2009).CrossRefGoogle Scholar
Dertinger, T., Colyer, R., Vogel, R., Enderlein, J., and Weiss, S., Optics Exp. 18(18), 18875–85 (2010).CrossRefGoogle Scholar
Dedecker, P., Duwé, S., Neely, R. K., and Zhang, J., Journal of Biomedical Optics 17(12), 126008 (2012).CrossRefGoogle Scholar
Dopf, K., Heunisch, S., Schwab, P., Moosmann, C., Habermehl, A., Lemmer, U., and Eisler, H.-J., Proceedings SPIE 91260 (2014).Google Scholar
Pashaee, F., Hou, R., Gobbo, P., Workentin, M. S., and Lagugne, F., The Journal of Physical Chemistry C 117, 15639–15646 (2013).CrossRefGoogle Scholar