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Computational Modeling For Magnetic-Sensor-Based Three-Dimensional Visualization Of Microcracks

Published online by Cambridge University Press:  21 March 2011

Leonid Muratov ,
David Lederman  and
Bernard R. Cooper
Leonid Muratov
Affiliation:
West Virginia University, Morgantown, WV 26506-6315
David Lederman
Affiliation:
West Virginia University, Morgantown, WV 26506-6315
Bernard R. Cooper
Affiliation:
West Virginia University, Morgantown, WV 26506-6315
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Abstract

The presence of cracks, phase segregation, or even submicron-sized grain boundaries creates a disruption of the magnetic field response to an externally applied electrical current running through the material. These effects can be detected through the magnetic field leakage in the external near-surface region. Using a computer model of an array of magnetic tunnel junction detectors, magnetic “signatures” of various faults and/or material borders and domains have been calculated using finite element analysis and portrayed by icons. We have considered a number of typical cracks and flaws, of different dimensions and orientations, within the bulk of the component. The database of “signatures” thus generated allows fast recognition of faults and generation of their images in real time. Significant efforts have been made to provide an adequate three-dimensional visualization of the shape and distribution of microcracks, the magnetic field lines, and delineation of the position of the faults in relation to the surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 674: Symposia T/U/V – Applications of Ferromagnetic and Optical Materials, Storage and Magnetoelectronics , 2001 , T2.4
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1 Jiles, D., Magnetism and Magnetic Materials, 2nd Edition (Chapman & Hall, London, 1998).Google Scholar
2 Ueseka, M., Hakuta, K., Miya, K., Aoki, K., and Takahashi, A., “Eddy-Current Testing by Flexible Microloop Magnetic Sensor Array”, IEEE Trans. Magn. 34, 2287 (1998).Google Scholar
3 Moodera, J. S., Kinder, L. R., Wong, T. M., and Meservey, R., “Large magnetoresistance at room temperature in ferromagnetic thin film tunnel junctions”, Phys. Rev. Lett. 74, 3273 (1995)Google Scholar
4 Julliere, M., Phys. Lett. 54A 225 (1975).Google Scholar
5 Tondra, M., Daughton, J. M., Wang, D., Beech, R. S., Fink, A., and Taylor, J. A., J. Appl. Phys. 83, 6688 (1998).10.1063/1.367861Google Scholar
6 Hwang, J., and Lord, W., Finite Element Modeling Field/Defect Interactions, Journal of Testing and Evaluation 3 (1975) 21–23.Google Scholar
7 Garboczi, E. J. “Finite Element and Finite Difference Programs for Computing the Linear Electric and Elastic Properties of Digital Images of Random Materials”. NISTIR 6269; 211 p. December 1998.10.6028/NIST.IR.6269Google Scholar