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Computer Interfaced Electron Microscope

Published online by Cambridge University Press:  21 February 2011

Y. Kokubo ,
S. Moriguchi ,
J. Hosoi ,
E. Watanabe  and
J. Nash
Y. Kokubo
Affiliation:
Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan
S. Moriguchi
Affiliation:
Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan
J. Hosoi
Affiliation:
Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan
E. Watanabe
Affiliation:
Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan
J. Nash
Affiliation:
Jeol Ltd., 1418 Nakagami, Akishima, Tokyo 196, Japan Jeol (U.S.A.) Inc., 11 Dearborn Road, Peabody, MA 01960, U.S.A.
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Abstract

Some applications of the computer for the electron microscope, in three major areas - 1) control of the microscope,2) image processing, and 3) structure Analysis - are discussed in the present paper.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 23
Copyright
Copyright © Materials Research Society 2006

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References

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