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Defect chemistry and electrical properties of a Pr-CeO2 solid solution: From nano- to micro-scale

Published online by Cambridge University Press:  12 October 2011

S. R. Bishop ,
J-J. Kim ,
N. Thompson  and
H. L. Tuller
S. R. Bishop
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
J-J. Kim
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
N. Thompson
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
H. L. Tuller
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
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Abstract

In nano-crystalline ceramics, the grain boundary volume fraction is large relative to that in micro-crystalline materials and can therefore become the dominant factor in determining its electrical, chemical, and mechanical properties. Reduced enthalpies of defect formation for nanocrystalline Pr0.1Ce0.9O2-δ , derived from thermo-gravimetric and impedance spectroscopy measurements, are reported. In addition, observations of cerium carbonate formation on nanoporous materials and implications for thermo-gravimetric analysis are discussed.

Keywords

nanoscaleelectrical propertiesionic conductor

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1331: Symposium K – Frontiers of Solid-State Ionics , 2011 , mrss11-1331-k02-02
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Suzuki, T., Kosacki, I. and Anderson, H. U., “Defect and mixed conductivity in nanocrystalline doped cerium oxide,” J Am Ceram Soc, vol. 85, pp. 1492–1498, 2002.Google Scholar
2. Chiang, Y. M., Lavik, E. B., Kosacki, I., Tuller, H. L. and Ying, J. Y., “Nonstoichiometry and electrical conductivity of nanocrystalline CeO2-x ,” J. Electroceram., vol. 1, pp. 7–14, 1997.Google Scholar
3. Tschope, A. and Birringer, R., “Grain size dependence of electrical conductivity in polycrystalline cerium oxide,” J. Electroceram., vol. 7, pp. 169–177, 2001.Google Scholar
4. Bishop, S. R., Stefanik, T. and Tuller, H. L., “Electrical conductivity and defect equilibria of Pr0.1Ce0.9O2-d ,” Phys. Chem. Chem. Phys., In Press, DOI: 10.1039/c0cp02920c.Google Scholar
5. Bishop, S. R., Chen, D., Kuru, Y., Kim, J-J., Stefanik, T. and Tuller, H. L., “Measurement and modeling of electrical, mechanical, and chemical properties of a model mixed ionic electronic conductor: Pr doped Ceria,” ECS Trans., vol. 33, pp. 51–57, 2011.Google Scholar
6. Stefanik, T. S., “Electrical Properties and Defect Structure of Praseodymium-Cerium Oxide Solid Solutions,” PhD thesis, Massachusetts Institute of Technology, 2004.Google Scholar
7. Bishop, S. R., Higgins, W., Ciampi, G., Churilov, A., Shah, K. S. and Tuller, H. L., “The Defect and Transport Properties of Donor Doped Single Crystal TlBr,” J. Electrochem. Soc., vol. 158, pp. J47–J51, 2011.Google Scholar
8. Nowick, A. S., Vaysleyb, A. V. and Kuskovshy, I., “Universal dielectric response of variously doped CeO2 ionically conducting ceramics,” Phys. Rev. B, vol. 58, pp. 8398–8406, 1998.Google Scholar
9. Hertz, J. L. and Tuller, H. L., “Measurement and finite element modeling of triple phase boundary-related current constriction in YSZ,” Solid State Ionics, vol. 178, pp. 915–923,, 2007.Google Scholar
10. Tabakova, T., Boccuzzi, F. B., Manzoli, M. and Andreeva, D., “FTIR study of low-temperature water-gas shift reaction on gold/ceria catalyst,” Appl. Catal. A-Gen., vol. 252, pp. 385–397, 2003.Google Scholar