Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-28T20:40:46.067Z Has data issue: false hasContentIssue false

Defect Generation and Suppression During the Impurity Induced Layer Disordering of Quantum Sized GaAs/GalnP Layers

Published online by Cambridge University Press:  25 February 2011

R. L. Thornton
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
D. P. Bour
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
D. Treat
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
F. A. Ponce
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
J. C. Tramontana
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
F. J. Endicott
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd. Palo Alto CA 94304
Get access

Extract

Impurity induced layer disordering (JILD) has been demonstrated as an extremely powerful technique for the fabrication of optoelectronic devices within the AlGaAs alloy system. The success of this technique in this material system is due in large part to the similarity of the lattice parameters between the two binary constituents in this system, AlAs and GaAs. There are many alloy systems in which it would be highly desirable to exploit the fabrication technique of JILD, but within which the binary alloy constituents are not so well matched in lattice parameter. Perhaps the most extensively explored of such systems are the AlGaInP alloy system lattice matched to a GaAs substrate and the InGaAsP alloy system lattice matched to an InP substrate.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Thornton, R. L., “Planar diffusion based processes for the fabrication of integrated optical and electronic componentsSPIE Proceedings Vol. 1582 p 194205, (1991)Google Scholar
2 ) Mathews, J. W. and Blakeslee, A. E., “Defects in epitaxial multilayers I. Misfit dislocationsJ. Cryst. Growth 27, 118 (1974)Google Scholar
3 ) Tsao, J. Y. and Dodson, B. W., “Excess stress and the stability of strained heterostructuresAppl. Phys. Lett. 53, 848 (1988)Google Scholar