Hostname: page-component-54dcc4c588-9xpg2 Total loading time: 0 Render date: 2025-09-22T06:49:30.455Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in the Structure of Σ=27 <110> Tilt Grain-Boundaries in Ge.

Published online by Cambridge University Press:  26 February 2011

Stuart Mckernan ,
C. Barry Carter  and
Zvi Elgat
Stuart Mckernan
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Zvi Elgat
Affiliation:
LUZ Industries Israel, Jerusalem 19073, Israel.
Get access

Abstract

General high-angle tilt grain-boundaries may be described by an arrangement of repeating structural units. A particular defect in the normal arrangement of structural units in a Σ=27 <110> tilt grain-boundary in Ge is reported.The defect is characterized by a short segment of (111) facet at the interface, and is associated with a screw dislocation in the boundary plane. This defect accommodates a slight misorientation of the boundary away from the perfect tilt configuration, andmay represent a type of structural unit present in other tilt boundaries containing a small twist component.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 637
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Elgat, Z.; PhD Thesis, Cornell University (1985)Google Scholar
2. Elgat, Z., and Carter, C.B.; Ultramicroscopy, 18, 313 (1985)Google Scholar
3. Smith, D.A., Elgat, Z., Krakow, W., Levi, A.A. and Carter, C.B., Ultramicroscopy, 30, 8 (1989)Google Scholar
4. Krakow, W.; Levi, A.A., and Pantelides, S.T.; J. Mat. Res., 5, 587 (1990)Google Scholar
5. Skrotzki, W., Wendt, H., Carter, C.B.; and Kohlstedt, D.L.; Mat. Res.Soc. Symp. Proc. 25,341 (1984)Google Scholar