Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-20T03:34:05.271Z Has data issue: false hasContentIssue false
  • English
  • Français

Double Crystal Synchrotron X-Ray Diffraction Study of Stoichiometry in Gallium Arsenide

Published online by Cambridge University Press:  28 February 2011

S. Cockerton ,
G.S. Green  and
B.K. Tanner
S. Cockerton
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
G.S. Green
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
B.K. Tanner
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
Get access

Abstract

The integrated X-ray diffraction intensities of quasi-forbidden reflections in gallium arsenide, such as the 002, are particularly sensitive to stoichiometry variations. We show here that the integrated intensity as a function of wavelength exhibits a minimum whose position is dependent on the stoichiometry. Using synchrotron radiation to tune the wavelength, we have performed measurements on a horizontal Bridgman grown crystal. A shift in the minimum is observed between measurements made from different parts of the sample consistent with arsenic loss at the surface of the crystal.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 65
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Potts, H.R. and Pearson, G.L. (1966) J.Appl.Physics. 37, 2098 CrossRefGoogle Scholar
2. Strausmanis, M.E. and Kim, C.D. (1965) Acta Cryst. 19, 256 CrossRefGoogle Scholar
3. Goldstein, B. and Almeleh, N. (1963) Appl.Phys.Letts. 2, 130 CrossRefGoogle Scholar
4. Logan, R.M. and Hurle, D.T.J. (1971) J. Phys. Chem. Solids, 32, 1739 CrossRefGoogle Scholar
5. Fujimoto, I. (1984) Japan J.Appl.Phys. 23, 287 CrossRefGoogle Scholar
6. Fujimoto, I. Kamata, N. Kobayashi, K. and Suzuki, T. (1986) Inst.Phys.Conf.Series 79, 199 Google Scholar
7. Cole, H. and Stemple, N.R. (1962) J.Appl.Phys. 33, 2227 CrossRefGoogle Scholar
8. Tanner, B.K., Barnett, S.J. and Hill, M.J. (1985) Inst. Phys. Conf. Ser. 76, 429 Google Scholar
9. James, R.W. The Optical Principles of The Diffraction of X-Rays (1948)Google Scholar
10. Honl, H. Ann. der Physik, (1933), 18, 625 CrossRefGoogle Scholar
11. Bowen, D.K. and Davies, S.T., (1983) Nucl. Inst. Meth. 208, 725 CrossRefGoogle Scholar