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Dynamical Laser Desorption Process of Ionic Clusters In Group Iv Elements

Published online by Cambridge University Press:  26 February 2011

A. Kasuya
Affiliation:
The Research Institute for Iron, Steel and Other Metals, Tohoku University, Sendai 980 Japan.
Y. Nishina
Affiliation:
The Research Institute for Iron, Steel and Other Metals, Tohoku University, Sendai 980 Japan.
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Abstract

Emission of ionic clusters from surfaces of group IV elements has been analyzed by means of time-of-flight measurements under nitrogep laser irradiation in its peak intensity ranging from 50 to 200 MW/cm with pulse duration of 10 ns. The measurements on Si, Ge and β-Sn with a straight flight tube show a continuous distribution of spectra in the flight time corresponding to the mass-to-charge ratio between 1 and 2 in units of the singly charged atom of respective elements. The line shape analysis indicates that emitted ions immediately after laser excitation are coagulated in the form of large clusters having nearly an equal mass-to-charge ratio between 5/4 and 3/2. They eventually decompose into monoatoms and their ions in a time scale of 10 ps as confirmed by a quadrupole mass analysis. These results are in remarkable contrast with the case of graphite which exhibits a series of sharp spectral peaks. The clear distinction between graphite and other group IV elements is attributed to the intrinsic difference in their chemical bonds under highly excited conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Ready, J. F., Effects of High Power Laser Radiation (Academic Press, New York, 1971).Google Scholar
2. Furstenau, N. and Hillenkamp, H., Int. J. Mass. Spectrom. Ion Phys. 37, 135 (1981).Google Scholar
3. Kasuya, A. and Nishina, Y., Phys. Rev. B28, 6571 (1983).Google Scholar
4. Chait, B. T. and Field, F. H., Int. J. Mass Spcetrometry and Ion Phys. 41, 17 (1981).CrossRefGoogle Scholar
5. Kasuya, A. and Nishina, Y., Secondary Ion Mass Spectroscopy SIMS IV, Springer Series in Chemical Physics 36, ed. Benninghoven, A. (Springer, Berlin, 1984), p. 164.Google Scholar
6. Pitzer, K. S. and , Clementi, J. Am. Chem. Soc. 81, 4477 (1959).Google Scholar