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The Effect of Temperature and Damage Energy on Amorphization in Zircon

Published online by Cambridge University Press:  15 February 2011

W. J. Weber ,
R. Devanathan ,
A. Meldrum ,
L. A. Boatner ,
R. C. Ewing  and
L. M. Wang
W. J. Weber
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352
R. Devanathan
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352
A. Meldrum
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831
L. A. Boatner
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831
R. C. Ewing
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, The University of Michigan, Ann Arbor, MI 48109
L. M. Wang
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, The University of Michigan, Ann Arbor, MI 48109
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Abstract

Several groups have irradiated single crystals of synthetic and natural zircon (ZrSiO4) with a wide range of ions (from He to Bi) over a wide range of temperatures. The results of these studies show that amorphization in zircon is controlled by a variety of parameters and is a more complex process than previously thought. The critical dose for amorphization increases with temperature, similar to other materials. However, the critical displacement dose (in dpa) for amorphization is significantly higher at lower temperatures (below 500 K) for very heavy ions, such as Pb and Bi. This unusual dependence on the damage energy density has not been observed previously in other materials. Possible explanations for this behavior in terms of amorphization mechanisms are discussed. In addition, there is a significant difference in the temperature dependence of the critical dose in synthetic and natural zircons, which suggests that the impurities in natural zircons may affect the kinetics of recovery processes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 540: Symposium N / Microstructural Processes in Irradiated Materials , 1998 , 367
Copyright
Copyright © Materials Research Society 1999

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References

[1] Harker, A.B. and Flintoff, J.F., J. Am. Ceram. Soc. 68, 159 (1985); J. Am. Ceram. Soc. 73, 1901 (1990).Google Scholar
[2] Feng, X., Surma, J.E., Whitworth, C.G., Eschenbach, R.C., and Leatherman, G.L., in Glass as a Waste Form and Vitrification Technology: Summary of an International Workshop (National Academy Press, Washington, DC, 1996), p. E.68.Google Scholar
[3] Knecht, D.A., O'Holleran, T.P., Vinjamuri, K., Raman, S.V., and Staples, B.A., in Glass as a Waste Form and Vitrification Technology: Summary of an International Workshop (National Academy Press, Washington, DC, 1996), p. E.78.Google Scholar
[4] Raman, S.V., Bopp, R., Batcheller, T.A., and Yan, Q., in Scientific Basis for Nuclear Waste Management XIX, edited by Murphy, W.M. and Knecht, D.A. (Mater. Res. Soc. Symp. Proc. 412, Pittsburgh, PA, 1996), p. 113.Google Scholar
[5] Ewing, R.C., Lutze, W., and Weber, W.J., J. Mater. Res. 10, 243 (1995).Google Scholar
[6] Ewing, R.C., Lutze, W., and Weber, W.J., in Disposal of Weapons Plutonium, edited by Merz, E. and Walter, C.E. (Kluwer Academic Publishers, Holland, 1996), p. 65.Google Scholar
[7] Anderson, E.B., Burakov, B.E., and Pazukhin, E.M., Radiochimica Acta 60, 149 (1993).Google Scholar
[8] Burakov, B.E., Anderson, E.B., Galkin, B. Ya., Starchenko, V.A., and Vasiliev, V.G., in Disposal of Weapons Plutonium, edited by Merz, E. and Walter, C.E. (Kluwer Academic Publishers, Holland, 1996), p. 85.Google Scholar
[9] Burakov, B.E., in: SafeWaste '93, Vol. 2 (1993), p. 19.Google Scholar
[10] Weber, W.J., J. Mater. Res. 5, 2687 (1990).Google Scholar
[11] Weber, W.J., J. Am. Ceram. Soc. 76, 1729 (1993).Google Scholar
[12] Weber, W.J., Ewing, R.C., and Wang, L.M., J. Mater. Res. 9, 688 (1994).Google Scholar
[13] Keller, C., Nukleonik 5, 41 (1963).Google Scholar
[14] Holland, H.D. and Gottfried, D., Acta Crystallogr. 8, 291 (1955).Google Scholar
[15] Murakami, T., Chakoumakos, B.C., Ewing, R.C., Lumpkin, G.R., and Weber, W.J., Amer. Mineralogist 76, 1510 (1991).Google Scholar
[16] Weber, W.J., Ewing, R.C., and Meldrum, A., J. Nucl. Mater. 250, 147 (1997).Google Scholar
[17] Babsail, L., Hamelin, N., and Townsend, P.D., Nucl. Instrum. and Methods B 59/60, 1219 (1991).Google Scholar
[18] Oliver, W.C., McCallum, J.C., Chakoumakos, B.C., and Boatner, L.A., Radiation Effects 132, 131 (1994).Google Scholar
[19] Devanathan, R., Weber, W.J., and Boatner, L.A., in Phase Transformations and Systems Driven Far From Equilibrium, edited by Ma, E., Bellon, P., Atzmon, M., and Tievedi, R. (Mater. Res. Soc. Symp. Proc. 481, Warrendale, PA, 1998), p. 419.Google Scholar
[20] Meldrum, A., Boatner, L.A., Weber, W.J., and Ewing, R.C., Geochimica et Cosmochimica Acta 62, 2509 (1998).Google Scholar
[21] Meldrum, A., Zinkle, S.J., Boatner, L.A., and Ewing, R.C., Nature, 395, 56 (1998).Google Scholar
[22] Meldrum, A., Zinkle, S.J., Boatner, L.A., and Ewing, R.C., Phys. Rev. B (1999) in press.Google Scholar
[23] Boatner, L.A. and Sales, B.C., in Radioactive Waste Forms for the Future, edited by Lutze, W. and Ewing, R.C. (Elsevier, Amsterdam, 1988), p. 495.Google Scholar
[24] Allen, C.W., Funk, L.L., Ryan, E.A., and Taylor, A., Nucl. Instrum. and Methods B 40–41, 553 (1988).Google Scholar
[25] Ziegler, J.F., Biersack, J.P., and Littmark, U., The Stopping and Range of Ions in Solids, (Pergamon, New York, 1985).Google Scholar
[26] Williford, R.E., Devanathan, R., and Weber, W.J., Nucl. Instrum. and Methods B 141, 94 (1998).Google Scholar
[27] Watson, E.B. and Cherniak, D.J., Earth and Planetary Science Letters 148, 527 (1997).Google Scholar
[28] Wendler, E., Heft, A., and Wesch, W., Nucl. Instrum. and Methods B 141, 105 (1998).Google Scholar
[29] Gibbons, J.F., Proc. IEEE 60, 1062 (1972).Google Scholar