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Effective Direct Piezoelectric Constants in Epitaxial Ferroelectric Films as MEMS Sensors

Published online by Cambridge University Press:  01 February 2011

Jun Ouyang ,
R. Ramesh  and
A. L. Roytburd
Jun Ouyang
Affiliation:
Materials Research and Science Engineering Center, Dept. of Materials Science and Engineering, University of Maryland, College Park, MD, 20742.
R. Ramesh
Affiliation:
Materials Research and Science Engineering Center, Dept. of Materials Science and Engineering, University of Maryland, College Park, MD, 20742. Current address: Dept. of Materials Science and Engineering, University of California, Berkeley, CA 94720-1760.
A. L. Roytburd
Affiliation:
Materials Research and Science Engineering Center, Dept. of Materials Science and Engineering, University of Maryland, College Park, MD, 20742.
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Abstract

Following our previous work on the converse piezoelectric constant- in epitaxial ferroelectric films for MEMS actuator applications, the orientation dependence of the direct piezoelectric constants , and are generally formulated, which can help to predict and optimize the performance of piezoelectric MEMS sensor devices based on ferroelectric thin films. Numerical results are obtained and discussed for Pb(ZrxTi1-x)O3 thin films grow on Si substrates with various compositions and structures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 881: Symposium CC – Coupled Nonlinear Phenomena Modeling and Simulation for Smart, Ferroic and Multiferroic Materials , 2005 , CC5.7
Copyright
Copyright © Materials Research Society 2005

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References

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