Hostname: page-component-54dcc4c588-mz6gc Total loading time: 0 Render date: 2025-10-03T19:38:08.431Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope

Published online by Cambridge University Press:  21 February 2011

Peter N. Hagemann  and
John S. Fahy
Peter N. Hagemann
Affiliation:
Electron Optics Laboratory, Philips Scientific and Industrial Equipment Division, N.V.Philips' Gloeilampenfabrieken, Eindhoven,The Netherlands.
John S. Fahy
Affiliation:
Product Manager, Electron Optics, Philips Electronic Instruments, Inc., Mahwah, N.J.
Get access

Extract

The past decade has seen the evolution of the Philips TEM from a “microscope”to an integrated microanalytical system. A current example of this trend is the EM 420*, an instrument whose design concepts are reflected in the most recently offered TEM, the compact, high kV, high resolution EM430.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 71
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

Anderson, W.H.J. and Fahy, J.S. (1976) Imaging thick specimens with the EM400 high Resolution Electron Microscope. Philips Electron Optics Bulletin, EM107, 10–12.Google Scholar
Fahy, J.S., Plomp, F.H., Rakels, C.J. and Thompason, M.N. (1976, 1977) The EM400 Transmission Electron Microscope Design.Philips Electron Optics Bulletin, EM1l0, 6–13.Google Scholar
Favard, P. (1980) Recent Aspects of Development of High Voltage Electron Microscopy. Electron Microscopy, 1980 (Den Haag), 2, Biology, 112–117.Google Scholar
Goldstein, J.I. (1979) Principles of Thin Film X-ray Microanalysis.Introduction to Analytical Electron Microscopy, ed. Hren, J. et al. , Plenum Press, New York and London, 83–120.Google Scholar
Hashimoto (1979) High Voltage TEN-contrast Theory. High Voltage Electron Microscopy, ed. Swann, P.R. et al. , Academic Press, London and New York, 9–21.Google Scholar
Joy, D.C. (1983) Practical Quantification for Energy Loss Spectra. Scanning Electron Microscopy, 1983, 1, 505–515.Google Scholar
Steeds, J.W. Convergent Beam Electron Diffraction. Introduction to Analytical Electron Microscopy, ed. Hren, J. et al. , Plenum Press, New York and London, 387–422.Google Scholar
Wolosewick, J.J. and Porter, K. R. (1979) Microtrabecular Lattice of the Cytoplastmatic Ground Substance--Artefact or Reality. J. Cell Biology, 82, 114–139.Google Scholar
Zaluzec (1979) Quantiative X-Ray Microanalysis: Instrumental Considerations and Applications to Materials Science. Introduction to Analytical Electron Microscopy, ed. Hren, J. et al. Plenum Press, New York and London, 121–167.Google Scholar
Zaluzec (1982) Private communication.Google Scholar