Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T08:23:15.649Z Has data issue: false hasContentIssue false

Electronic Structure of GaN Quantum Dots with an Adjacent Threading Dislocation

Published online by Cambridge University Press:  17 March 2011

A. D. Andreev
Affiliation:
A.F. Ioffe Institute, St.-Petersburg 194021, Russia, email:a.andreev@surrey.ac.uk Department of Physics, University of Surrey, Guildford, GU2 7XH, UK
J.R. Downes
Affiliation:
Queen Mary and Westfield College, London, E1 4NS, UK
E. P. O'Reilly
Affiliation:
Department of Physics, University of Surrey, Guildford, GU2 7XH, UK
Get access

Abstract

We present a theoretical analysis of the electronic structure of GaN quantum dots (QD) with an adjacent threading dislocation. The QD carrier spectra and wavefunctions are calculated using a plane-wave expansion method within an 8-band k.p model. The method is very efficient, because the strain and built-in electric fields can be included through their discrete Fourier transforms. The QD structures considered have been analysed experimentally by other groups. The GaN QDs are truncated hexagonal pyramids on a wetting layer with an edge dislocation adjacent to each dot. The built-in piezoelectric potential strongly influences the localisation of the carrier wavefunctions. This potential pushes the electrons to the top of the dot, the holes to the bottom and, additionally, causes strong lateral confinement of the carriers. The effect of the dislocation strain field at the dot edge on the carrier states in each GaN/AlN QD is shown to be insignificant. Results are presented for the confined state energies and optical matrix elements for a range of different sized dots with and without dislocations. The size of the dot influences the energies and overlaps, but the presence of the dislocation has minimal effect. The dependence of the ground state optical transition energy on the size of the dot is in good agreement with experimental data.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Pearton, S. J., Zolper, J. C., Shul, R. J., Ren, F., J. Appl. Phys., 86, 1 (1999)Google Scholar
2. O'Donnell, K. P., Martin, R. W., and Middleton, P. G., Phys. Rev.Lett., 82, 237 (1999)Google Scholar
3. Widmann, F., Simon, J., Daudin, D., Feuillet, G., Rouviere, J.L., Pelekanos, N.T., Fishman, G., Phys. Rev. B. 58, 15989 (1998).Google Scholar
4. Arley, M., Rouviere, J.L., Widmann, F., Daudin, B., Feuillet, G., Mariette, H., Appl. Phys. Let. 74, 3287 (1999).Google Scholar
5. Widmann, F., Daudin, B., Feuillet, G., Samson, Y., Rouviere, J.L., Pelekanos, N., J. Appl. Phys. 83, 7618 (1998)Google Scholar
6. Rouviere, J. L., Simon, J., Pelekanos, N., Daudin, B., and Feuillet, G., Appl. Phys. Lett., 75, 2632 (1999)Google Scholar
7. Andreev, A.D., Downes, J.R., Faux, D.A. and O'Reilly, E.P., J. Appl. Phys., 86, 297 (1999).Google Scholar
8. Andreev, A. D., O'Reilly, E.P., Thin Solid Films 364, 291 (2000).Google Scholar
9. Gutkin, M.Yu. and Aifantis, E.C., Scripta Materialia, 40, 559 (1999)Google Scholar
10. Bernardini, F., Fiorentini, V., Vanderbilt, D., Phys. Rev. B., 56, R10024 (1997).Google Scholar
11. Wright, A.F., J. Appl. Phys., 82, 2833 (1997)Google Scholar
12. Yeo, Y.C., Chang, T.C., Li, M.F., J. Appl. Phys., 83, 1429 (1998)Google Scholar
13. Kumagi, M., Chuang, S.L., Ando, H., Phys. Rev. B, 57, 15303 (1998)Google Scholar
14. Pugh, S.K., Dugdale, D.J., Brand, S., Abram, R.A., Semicond. Sci. Technol., 14, 23 (1999)Google Scholar