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Electronic Structure of the Organic Metals κ-Et2cu(SCN)2 and κ-Et2cu[N(Cn)2]Br Measured by Soft X-Ray Emission and Soft X-Ray Absorption

Published online by Cambridge University Press:  10 February 2011

Cristian B. Stagarescu ,
L.-C. Duda ,
Kevin E. Smith ,
J. H. Guo ,
J. Nordgren ,
R. Haddon ,
J. S. Brooks  and
D. Jeromé
Cristian B. Stagarescu
Affiliation:
Department of Physics, Boston University, Boston, MA, 02215
L.-C. Duda
Affiliation:
Department of Physics, Boston University, Boston, MA, 02215
Kevin E. Smith*
Affiliation:
Department of Physics, Boston University, Boston, MA, 02215
J. H. Guo
Affiliation:
Department of Physics, Uppsala University, Box 530, 75121 Uppsala, Sweden
J. Nordgren
Affiliation:
Department of Physics, Uppsala University, Box 530, 75121 Uppsala, Sweden
R. Haddon
Affiliation:
Bell Laboratories, Lucent Technologies
J. S. Brooks
Affiliation:
Department of Physics, Florida State University, Tallahassee, FL
D. Jeromé
Affiliation:
Laboratoire de Physique des Solides, Université de Paris-Sud
*
‡author to whom correspondence should be addressed. Electronic mail: ksmith@bu.edu.
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Abstract

The electronic structure of the two organic, layered metals κ-ET2Cu(SCN)2 and K-ET 2Cu[N(CN)2]Br has been studied using a combination of soft X-ray emission (SXE) and soft X-ray absorption (SXA) spectroscopy. These techniques are powerful probes of the site and angular-momentum resolved partial density of states (PDOS) for both occupied and unoccupied states. Therefore these spectroscopies are particularly suited for an analysis of the density of states of multi-atomic, complex materials as the ET-based organic conductors, allowing site-specific electronic structure to be measured. Furthermore, for certain materials, the electronic structure of specific layers can be measured. We present a preliminary picture of the electronic structure of κ-ET 2Cu(SCN)2 and κ-ET 2Cu[N(CN)2]Br as measured by SXE and SXA performed at the C-Is and N- Is core levels.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 489
Copyright
Copyright © Materials Research Society 1998

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Footnotes

†

On leave from the Institute of Microtechnology, Bucharest, Romania.

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