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Electrostatic Potentials at θ = 24° [001] Tilt Boundaries in Undoped and Doped Strontium Titanate Bicrystals

Published online by Cambridge University Press:  10 February 2011

Z. Mao ,
R. E. Dunin-Borkowski ,
C. B. Boothroyd  and
K. M. Knowles
Z. Mao
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, U.K.
R. E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, U.K.
C. B. Boothroyd
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, U.K.
K. M. Knowles
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, U.K.
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Abstract

Phase contrast techniques in the transmission electron microscope are used to measure directly the electrostatic potentials at θ = 24° [001] symmetrical tilt grain boundaries in both undoped and Nb-doped SrTiO3 bicrystals. The boundaries are all found to have significantly lower scattering potentials than the surrounding bulk material. The depths and the shapes of the potential wells at the boundaries are discussed in the light of both theoretical models of the grain boundary chemistry of pure and doped strontium titanate and other experimental data that we have acquired on these boundaries from high resolution transmission electron microscopy, diffuse dark field imaging, energy dispersive X-ray spectroscopy and electron energy loss spectroscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 458: Symposium W – Interfacial Engineering for Optimized Properties , 1996 , 109
Copyright
Copyright © Materials Research Society 1997

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References

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