Hostname: page-component-cb9f654ff-rkzlw Total loading time: 0 Render date: 2025-09-10T09:13:30.421Z Has data issue: false hasContentIssue false
  • English
  • Français

Enhanced Performance of Symmetric Double Layer Capacitor by Flexible Binder-free SWCNT Membrane Electrodes

Published online by Cambridge University Press:  10 April 2013

Danhao Ma ,
James Kalupson ,
Pralav Shetty ,
Kofi Adu  and
Ramakrishnan Rajagopalan
Danhao Ma
Affiliation:
Department of Energy Engineering, The Pennsylvania State University, University Park, PA 16802. U.S.A.
James Kalupson
Affiliation:
Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Pralav Shetty
Affiliation:
Department of Mechanical and Nuclear Engineering, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Kofi Adu
Affiliation:
Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, U.S.A. Department of Physics, The Pennsylvania State University, Altoona College, Altoona, PA 16601, U.S.A.
Ramakrishnan Rajagopalan
Affiliation:
Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Get access

Abstract

We present results on an aqueous symmetric double layer electrochemical capacitor (EDLC) constructed with a flexible binder-free single wall carbon (SWCNTs) membrane as electrodes. The capacitors were cycled from 0 to 1V @ 10 A/g for 10,000 cycles with 99.9% coulombic efficiency and 94% energy efficiency, and 100% depth of discharge. The power performance of the aqueous symmetric SWCNTs membrane capacitor is almost 100 –1000 times better than commercial non-aqueous EDLC capacitors.

Keywords

energy generationenergy storagenanostructure

Information

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1505: Symposium W – Carbon Nanomaterials , 2013 , mrsf12-1505-w03-38
Copyright
Copyright © Materials Research Society 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

Iijima, S., Nature, 1991. 354(6348): p. 56–58.CrossRefGoogle Scholar
An, K.H., Kim, W.S., Park, Y.S., Choi, Y.C., Lee, S.M., Chung, D.C., Bae, D.J., Lim, S.C., Lee, Y.H., Adv. Mater. 2001 13, :p 497–500.3.0.CO;2-H>CrossRefGoogle Scholar
Hughes, M., Shaffer, M.S.P., Renouf, A.C., Singh, C., Chen, G.Z., Fray, J., Windle, A.H., Adv. Mater., 2002, 14, :p 382–385.3.0.CO;2-Y>CrossRefGoogle Scholar
Hughes, M., Chen, G.Z., Shaffer, M.S.P., Fray, D.J., Windle, A.H., Chem. Mater., 2002, 14,:p1610–1613.CrossRefGoogle Scholar
An, K.H., Kim, W.S., Park, Y.S., Moon, J.M., Bae, D.J., Lim, S.C., Lee, Y.S., Lee, Y.H., Adv. Function. Mater., 2001, 11, :p 387–392.3.0.CO;2-G>CrossRefGoogle Scholar
Liu, C.Y., Bard, A.J., Wudl, F., Weitz, I., Heath, J.R., Electrochem. Solid State Lett. 1999, 2, :p 577–578.CrossRefGoogle Scholar
Barisci, J.N., Wallace, G.G., Baughman, R.H., J. Electroanal. Chem., 2000, 488, :p 92–98.CrossRefGoogle Scholar
Diederich, L., Barborini, E., Piseri, P., Podesta, A., Milani, P., Schneuwly, A., Gallay, R., Appl. Phys. Lett., 1999, 75, :p 2662–2664.CrossRefGoogle Scholar
Frackowiak, E., Metenier, K., Bertagna, V., Beguin, F., Appl. Phys. Lett., 2000, 77, :p 2421–2423.CrossRefGoogle Scholar
Claye, A.S., Fischer, J.E., Huffman, C.B., Rinzler, A.G., Smalley, R.E., J. Electrochem. Soc., 2000, 147, :p 2845–2852.CrossRefGoogle Scholar
Frackowiak, E., Gautier, S., Gaucher, H., Bonnamy, S., Beguin, F., Carbon, 1999, 37, :p 61–69.CrossRefGoogle Scholar
Gao, B., Kleinhammes, A., Tang, X.P., Bower, C., Fleming, L., Wu, Y., Zhou, O., Chem. Phys. Lett., 1999, 307, :p153–157.CrossRefGoogle Scholar
Nutzenadel, C., Zuttel, A., Chartouni, D., Schlapbach, L., Electrochem. Solid State Lett., 1999, 2, :p 30–32.CrossRefGoogle Scholar
Zhao, J; Buldum, A ; Han, J; Lu, JP, Physical Review Letters, 2000. 85(8): p. 1706–1709.CrossRefGoogle Scholar
Udomvech, A., Kerdcharoen, T., and Osotchan, T., Chemical Physics Letters, 2005. 406(1-3): p 161–166.CrossRefGoogle Scholar
Du, C.S. and Pan, N; Journal of Power Sources, 2006. 160(2): p. 1487–1494.CrossRefGoogle Scholar
Niu, C.M., Sichel, E.K., Hoch, R., Moy, D., Tennent, H., Appl. Phys. Lett. 70 (1997) 1480–1482.CrossRefGoogle Scholar
Yoon, BJ; Jeong, SH; Lee, KH; Kim, HS ; Park, CG ; Han, JH; Chemical Physics Letters, 2004. 388(1-3): p. 170–174.CrossRefGoogle Scholar
Chen, JH; Li, WZ; Wang, DZ; Yang, SX; Wen, JG; Ren, ZF Carbon, 2002. 40(8): p. 1193–1197.CrossRefGoogle Scholar
An, KH; Jeon, KK; Kim, WS; Park, YS; Lim, SC; Bae, DJ ; Lee, YH Journal of the Korean Physical Society, 2001. 39: p. S511–S517.Google Scholar
Ng, SH; Wang, J; Guo, ZP; Wang, GX; Liu, HK, Electrochimica Acta, 2005. 51(1): p. 23–28.CrossRefGoogle Scholar
Futaba, DN; Hata, K; Yamada, T ; Hiraoka, T Hayamizu, Y ; Kakudate, Y ; Tanaike, O ; Hatori, H ; Yumura, M.; Nature Materials, 2006. 5(12): p. 987–994 CrossRefGoogle Scholar