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Evolution of Roughness on InP Layers Observed by Scanning Force Microscopy

  • M. A Cotta (a1), R. A Hamm (a1), S. N. G Chu (a1), T. W Staley (a1) (a2), L. R Harriott (a1), M. B Panish (a1) and H. Temkin (a3)...
Abstract
Abstract

The evolution of surface roughness with increasing thickness of (100) InP layersgrown by metalorganic molecular beam epitaxy has been observed by scanningforce microscopy. The process of roughening gives rise to periodic elongatedfeatures on the surface aligned in the [011] direction, reflecting the surfaceanisotropy. The morphology eventually evolves to a grain-like surface. Theroughening is dependent on both the group III and V flux, and the growthtemperature, indicating that this phenomenon is kinetically controlled by surfacediffusion activation. For each set of parameters chosen for the growth, there is aminimum temperature where smooth, two-dimensional growth can be obtained.Below that temperature the roughening shows two distinct power law regimesdependent on the epitaxial layer thickness.

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  • EISSN: 1946-4274
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