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Evolving Surface Cusps During Strained Layer Epitaxy

  • D. E. Jesson (a1), S. J. Pennycook (a1), J.-M. Baribeau (a2) and D. C. Houghton (a2)

We have combined Z-contrast imaging and Ge marker layer experiments to study the evolving surface morphology of SixGel-x alloys grown by molecular beam epitaxy (MBE). Surface cusps are seen to arise as the intersection lines between coherent islands. The potential implications of stress concentrations associated with cusps are considered with a view to strain relaxation in the film via dislocation nucleation.

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[12] We would like to thank Carney S. L., Estes T. C., and J. T. Luck for technical assistance. This research was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-84OR21400 with Martin Marietta Energy Systems, Inc.
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  • EISSN: 1946-4274
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