Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-27T22:38:28.758Z Has data issue: false hasContentIssue false
  • English
  • Français

Far Infrared Measurements on Single Crystals, Films and Bulk Sintered High Temperature Superconductors

Published online by Cambridge University Press:  28 February 2011

T. W. Noh ,
P. E. Sulewski ,
S. G. Kaplan ,
A. J. Sievers ,
D. K. Lathrop  and
R. A. Buhrman
T. W. Noh
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
P. E. Sulewski
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
S. G. Kaplan
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
A. J. Sievers
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
D. K. Lathrop
Affiliation:
School of Applied and Engineering Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
R. A. Buhrman
Affiliation:
School of Applied and Engineering Physics and Materials Science Center, Cornell University, Ithaca, NY 14853.2501
Get access

Abstract

We report measurements of the reflectivity of bulk samples, films and single crystals of high Tc materials. The data are fitted with the Mattis-Bardeen theory to obtain gap values. For sintered samples we find 2Δ/kTc = 2.6, while for YBa2Cu3O7-y films and single crystals 2Δ/kTc = 6.4 and 7.7 respectively.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 435
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Stroud, D., Phys. Rev. B 12, 3368 (1975).Google Scholar
2. Bassat, J.M., Odier, P., and Gervais, F., Phys. Rev. B 35, 7126 (1987).Google Scholar
3. Sulewski, P.E., Noh, T.W., McWhirter, J.T., and Sievers, A.J., Phys. Rev. B 36, 5735 (1987).Google Scholar
4. Mattis, D.C. and Bardeen, J., Phys. Rev. 111. 412 (1987).Google Scholar
5. Sulewski, P.E., Noh, T.W., McWhirter, J.T., Sievers, A.J., Russek, S.E., Buhrman, R.A., Jee, C.S., Crow, J.E., Salomon, R.E., Myer, G., Phys. Rev. B 36, 2357 (1987).Google Scholar
6. Noh, T.W., Sulewski, P.E., and Sievers, A.J., Phys. Rev. B 36, (1987).Google Scholar
7. Orenstein, J., Thomas, G.A., Rapkine, D.H., Bethea, C.G., Levine, B.F., Cava, R.J., Rietman, E.A., and Johnson, D.W. Jr, Phys. Rev. B 36, 729 (1987).Google Scholar
8. Schneemeyer, L.F., Waszczak, J.V., Siegrist, T., van Dover, R.B., Rupp, L.W., Batlogg, B., Cava, R.J., Murphy, D.W., Nature 328, 601 (1987).Google Scholar
9. Schlesinger, Z., Collins, R.T., Kaiser, D.L., and Holtzberg, F., Phys. Rev. Lett. 59, 1959 (1987).Google Scholar