Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-20T02:46:49.267Z Has data issue: false hasContentIssue false

Grain-Oriented Lithium Niobate Thin-Layers Prepared by Sol-Gel Methods

Published online by Cambridge University Press:  16 February 2011

Daniel S. Hagberg
Affiliation:
Department of Materials Science and Engineering, and the Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
D. A. Payne
Affiliation:
Department of Materials Science and Engineering, and the Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
Get access

Abstract

Thin-layers of lithium niobate were deposited on polycrystalline platinum and (001) sapphire. Preferred orientation was observed by x-ray diffraction measurements, and confirmed by x-ray rocking curve studies. The orientation was [006] LiNbO3 with [111] Pt and [001] Al2O3. Dielectric data are reported for grain oriented LiNbO3 as a function of frequency for layer thicknesses from 0.15 to 0.70 μm.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Miyazawa, S., Appl. Phys. Lett. 23 (4), 198 (1973).Google Scholar
2. Betts, R. A. and Pitt, C. W., Electronics Letters 21 (21), 960 (1985).Google Scholar
3. Hewig, G. H., et al., Thin Solid Films 88, 67 (1982).Google Scholar
4. Kanata, T., et al., J. Appl. Phys. 62 (7), 2989 (1987).Google Scholar
5. Meek, P. R., et al., Thin Solid Films 141, 251 (1986).Google Scholar
6. Eichorst, D. J. and Payne, D. A., in Better Ceramics Through Chemistry III, MaL Res. Soc. Symp. Proc., 121, 773 (1988).Google Scholar
7. Yanovskaya, M. I., et al., J. Mat. Sci., 23, 395 (1988).Google Scholar
8. Hirano, S. I. and Kato, K., Adv. Ceram. Mat. 3, 503 (1988).Google Scholar
9. Partlow, D. P. and Greggi, J., J. Mater. Res. 2, 595 (1987).Google Scholar
10. Eichorst, D. J. (private communication).Google Scholar
11. Eichorst, D. J., et al., to appear in Inorg. Chem 29 (8), 1990.Google Scholar
12. ASTM card number 20–631.Google Scholar
13. Weis, R. S. and Gaylord, T. K., Appl. Phys. A 37, 191 (1985).Google Scholar