Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Park, Kyung-ho
1990.
Cross-Sectional TEM Specimen Preparation of Semiconductor Devices by Focused Ion Beam Etching.
MRS Proceedings,
Vol. 199,
Issue. ,
Benedict, J.P.
Anderson, Ron
and
Klepeis, S. J.
1990.
A procedure for cross-sectioning materials for TEM analysis without ion milling.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 48,
Issue. 4,
p.
742.
McCaffrey, J.P.
1991.
Small-angle cleavage of semiconductors for transmission electron microscopy.
Ultramicroscopy,
Vol. 38,
Issue. 2,
p.
149.
Parker, M.A.
Johnson, K.E.
Hwang, C.
and
Bermea, A.
1991.
Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 49,
Issue. ,
p.
762.
Li, Z.G.
Carcia, P.F.
and
Donohue, P.
1992.
HREM applications to industrial products: Observation of thick-film resistors with very large electron transparent area.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 50,
Issue. 1,
p.
140.
Madsen, Lynnette D.
and
Weaver, Louise
1992.
Examination of barrier layers for lead zirconate titanate thin films.
Journal of Electronic Materials,
Vol. 21,
Issue. 1,
p.
93.
Smith-Wackerle, V.L.
and
Trybus, C.L.
1992.
New life for unusable electropolished TEM foils.
Ultramicroscopy,
Vol. 40,
Issue. 2,
p.
187.
Cerva, H.
Huber, V.
Eckers, W.
and
Mitwalsky, A.
1993.
Specific preparation procedures for failure analysis of (sub)micron areas in silicon devices.
Ultramicroscopy,
Vol. 52,
Issue. 1,
p.
127.
Yao, G.D.
Lu, Y.C.
Prasad, S.
Hata, W.
Chen, F.S.
and
Zhang, H.
1993.
Electrical and Physical Characterization of Tin Diffusion Barrier for Sub-Micron Contact Structure.
MRS Proceedings,
Vol. 303,
Issue. ,
Liu, J. B.
Tracy, B. M.
and
Gronsky, R.
1993.
Selected area polishing for precision TEM sample preparation.
Microscopy Research and Technique,
Vol. 26,
Issue. 2,
p.
162.
Shishido, Howard
and
Su, David
1994.
Preparation of Transmission Electron Microscopy specimens of integrated circuits usinga modified tripod polisher.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 52,
Issue. ,
p.
872.
Matsuda, Asher T
Liaw, H. Ming
Cronin, Wayne A
Tompkins, Harland G
Fejes, Peter L
and
Evans, Keenan L
1994.
Polycrystalline Grain Structure of Sputtered Aluminum Nitride Films.
MRS Proceedings,
Vol. 343,
Issue. ,
Kotula, Paul G.
and
Barry Carter, C.
1995.
The measurement of thin-film reaction layers with high-resolution FESEM.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 53,
Issue. ,
p.
330.
Yu, E. T.
Barmak, K.
Ronsheim, P.
Johnson, M. B.
McFarland, P.
and
Halbout, J.-M.
1996.
Two-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy.
Journal of Applied Physics,
Vol. 79,
Issue. 4,
p.
2115.
Barna, Árpád
and
Pécz, Béla
1996.
Handbook of Microscopy.
p.
751.
Cinibulk, Michael K.
Welch, John R.
and
Hay, Randall S.
1996.
Preparation of Thin Sections of Coated Fibers for Characterization by Transmission Electron Microscopy.
Journal of the American Ceramic Society,
Vol. 79,
Issue. 9,
p.
2481.
1996.
Handbook of Microscopy Set.
p.
751.
Cosemans, P.
D'Olieslaeger, M.
de Ceuninck, W.
de Schepper, L.
and
Stals, L.
1996.
Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometry.
p.
1699.
Cinibulk, M. K.
Welch, J. R.
and
Hay, R. S.
1997.
Transmission Electron Microscopy Specimen Preparation of Ceramic Coatings on Ceramic Fibers.
MRS Proceedings,
Vol. 480,
Issue. ,
Shlepr, MG
Schrantz, GA
Rivoli, AL
and
Bajor, G
1997.
The Influence of Dopant Type on Polysilicon Grain Growth and Solid Phase Epitaxial Regrowth.
Microscopy and Microanalysis,
Vol. 3,
Issue. S2,
p.
477.