Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-25T03:52:40.451Z Has data issue: false hasContentIssue false
  • English
  • Français

Heteroepitaxy of InSe/GaSe on Si(111) Substrates

Published online by Cambridge University Press:  01 February 2011

J. Jasinski ,
Z. Liliental-Weber ,
A. Chaiken ,
G.A. Gibson ,
K. Nauka ,
C.C. Yang  and
R. Bicknell
J. Jasinski
Affiliation:
Lawrence Berkeley National Laboratory, Materials Science Division, Berkeley, CA 94720, USA
Z. Liliental-Weber
Affiliation:
Lawrence Berkeley National Laboratory, Materials Science Division, Berkeley, CA 94720, USA
A. Chaiken
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA, USA
G.A. Gibson
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA, USA
K. Nauka
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA, USA
C.C. Yang
Affiliation:
Hewlett-Packard Laboratories, Palo Alto, CA, USA
R. Bicknell
Affiliation:
Hewlett-Packard, Imaging and Printing Division, Corvallis, OR, USA
Get access

Abstract

High quality growth of InSe on Si(111) was achieved by insertion of GaSe buffer layer. Rhombohedral polytypes were formed in both the InSe and GaSe layers. Twinning and stacking disorder was often detected in these materials due to their layered structure. Moreover, in samples with a thin GaSe layer, strong interdiffusion of indium into the GaSe layer was detected that resulted in the formation of an InxGaySe phase. The dominant threading defects present in these InSe/GaSe heterostructures were screw dislocations, which may act as nonradiative recombination centers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , GG4.5
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gibson, G. A., et al, patent # 5, 557, 596.Google Scholar
2. Chaiken, A., Gibson, G. A., Chen, J., Yeh, B. S., Jasinski, J., Liliental-Weber, Z., Nauka, K., Yang, C. C., Lindig, D. D., and Sivaramakrishnan, S., Nanotechnology, submitted.Google Scholar
3. Chernyak, L., Osinsky, A., Nootz, G., Schulte, A., Jasinski, J., Benamara, M., Liliental-Weber, Z., Look, D.C., Molnar, R.J., Appl. Phys. Lett. 77, 2695 (2000).Google Scholar
4. Sánchez-Royo, J. F., Segura, A., Lang, O., Schaar, E., Pettenkofer, C., Jaegermann, W., Roa, L., and Chevy, A., J. Appl. Phys. 90, 2818 (2001).Google Scholar
5. Budiman, Maman, Yamada, Akira and Konagai, Makoto, Jpn. J. Appl. Phys. 37, 4092 (1998).Google Scholar
6. Meng, Shuang, Schroeder, B. R., and Olmstead, Marjorie A., Phys. Rev. B 61, 7215 (2000).Google Scholar