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High Performance Photoluminescence Spectroscopy using Fourier Transform Interferometry

Published online by Cambridge University Press:  25 February 2011

M.L.W. Thewalt ,
M.K. Nissen ,
D.J.S. Beckett  and
K.R. Lundgren
M.L.W. Thewalt
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
M.K. Nissen
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
D.J.S. Beckett
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
K.R. Lundgren
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
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Abstract

We present recent results on the applications of Fourier transform techniques to photoluminescence spectroscopy as it relates to both basic and characterization-related semiconductor research. The emphasis here is on demonstrating the advantages of these methods in situations requiring very high spectral resolution and/or very high sensitivity. We also provide an example of the utility of interferometry in performing photoluminescence excitation spectroscopy in spectral regions where broadly tunable laser sources are not readily available.

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