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High real-space resolution structure of materials by high-energy x-ray diffraction

Published online by Cambridge University Press:  10 February 2011

V. Petkov ,
S. J. L. Billinge ,
J. Heising ,
M. G. Kanatzidis ,
S. D. Shastri  and
S. Kycia
V. Petkov
Affiliation:
Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, MI 48823
S. J. L. Billinge
Affiliation:
Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, MI 48823
J. Heising
Affiliation:
Department of Chemistry and Center for Fundamental Materials Research, Michigan State University, East Lansing, MI 48823
M. G. Kanatzidis
Affiliation:
Department of Chemistry and Center for Fundamental Materials Research, Michigan State University, East Lansing, MI 48823
S. D. Shastri
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
S. Kycia
Affiliation:
Cornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14853
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Abstract

Results of high-energy synchrotron radiation experiments are presented demonstrating the advantages of the high-resolution atomic Pair Distribution Function technique in determining the structure of materials with intrinsic disorder.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 151
Copyright
Copyright © Materials Research Society 2000

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References

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