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High Resolution Electron Microscopy of Grain Boundaries in Sintered High-Tc Superconductor YBa2Cu3O7-x

Published online by Cambridge University Press:  26 February 2011

Yoichi Ishida ,
H. Ichinose  and
W. Wunderlich
Yoichi Ishida
Affiliation:
Institute of Industrial Science, University of Tokyo, 7 Roppongi, Minato-ku, Tokyo 106 Japan
H. Ichinose
Affiliation:
Institute of Industrial Science, University of Tokyo, 7 Roppongi, Minato-ku, Tokyo 106 Japan
W. Wunderlich
Affiliation:
Max-Planck-lnstitute fur Metallforshung, Institute fur Werkstoffwissenscahften, 92 Seestrasse, Stuttgart 1, D-7000, West Germany
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Abstract

Grain boundaries in as-sintered high-Tc YBa2Cu3O7-x were often found to contain thin amorphous layers up to 2nm in thickness. planar grain boundaries parallel to the c plane of one of the crystals tended to have thick layers, while the other boundaries were with layers of negligible width. The boundary width apparently increased in the specimens sealed in a quartz tube, re-heated at 773K and slowly cooled, even though the chemistry of the boundary layer was preserved except oxygen. Even a thin layer of other compounds was found in the c-plane type boundary when the specimen was re-sintered at above 1200K. These phenomena may be explained by the cracking of the interface and a liquidus valley between YBa2Cu3O7-x. The deterioration of the resistivity characteristics of the specimen is attributed to these changes of the grain boundaries.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 122: Symposium I – Interfacial Structure, Properties, and Design , 1988 , 515
Copyright
Copyright © Materials Research Society 1988

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References

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