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High Resolution Lattice Images of G.P.Zones and Solute Clusters in Al-Cu and Cu-Be Alloys

Published online by Cambridge University Press:  21 February 2011

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Abstract

Atomic structures of G.P. zones and solute clusters in Al-Cu and Cu-Be alloys are studied by the atom resolution electron microscope images. The images of plate-like G.P. zones appear as dotted images with various brightnesses along (200) lattice planes. The solute clusters are also observed along (111) lattice planes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

1. Kelly, A. and Nicolson, R.B.:Prog.Mater.Sci.(Pergamon Press,1963),10, p.151 Google Scholar
2. Nicolson, R.N. and Nutting, J.: Phil.Mag.,3, 531 (1858);Google Scholar
2a Nicolson, R.B., Thomas, G. and Nutting, J.: J.Inst.Metals, 87, 429 (19581959)Google Scholar
3. Hornbogen, E.: Aluminium, 43, 41,115,163 (1967)Google Scholar
4. Yoshida, H., Cockayne, D.J.H. and Whelan, M.J.: Electron Microscopy 1974 (Australian Academy Sci.,1974), p.430;Google Scholar
4a Phil.Mag. 34, 89 (1976)Google Scholar
5. Yoshida, H., Ann.Repts Res.Reactor Inst.Kyoto Univ., 10, 101 (1977).Google Scholar
6. Persons, J.R.,Roinville, M. and Hoelk, C.W.: Phil.Mag., 21, 1105 (1970).Google Scholar
7. Philips, V.A.: Acta.Met., 21, 219 (1973);Google Scholar
7a 23, 751 (1975).Google Scholar
8. Ando, Y., Mihama, K., Takahashi, T. and Kojima, Y.: Electron Microscopy 1974 (Australian Academy Sci., 1974), p.658;Google Scholar
8a Acta. Met., A31,C263(1975)Google Scholar
9. Yoshida, H., Hashimoto, H. and Yokota, Y.: Electron Microscopy 1978, 1, p. 306 (1978);Google Scholar
9a Ann. Repts Res.Reactor Inst. Kyoto Univ. 13, 208(1980)Google Scholar
10. Yoshida, H., Hashimoto, H. and Yokota, Y.: Electron Microscopy 1980, 1, 268 Google Scholar
11. Dorignac, D., Casanove, M.J., Jagut, R. and Jouffrey, B.: Electron Microscopy 1980, 4, 174 (1980).Google Scholar
12. Sato, T.,Kojima, Y. and Takahashi, T.:J.Japan Inst. Metals, 4 803 (1982).Google Scholar
13. Auvray, X., Gergopoulos, P. and Cohen, J.B.: Acta Met., 29, 1061 (1981);Google Scholar
13a Cohen, J.B. and Georgopoulos, P.: Scripta Met.,16, 1107 (1982).Google Scholar
14. Gerold, V. and Bubeck, E.: Scripta Met., 16, 1101 (1982).Google Scholar
15. Abe, T.,Miyazaki, K. and Hirano, K.: Acta Met., 30, 357 (1982).Google Scholar
16. Hashimoto, H. and Endo, H.: Proc.50th Anniv. Elect. Diff., Inst.Phys.Conf. Ser. No.41(Inst.Phys.,1978), p. 188.Google Scholar
17. Hashimoto, H., Endo, H., Takai, Y., Tomita, H. and Yokota, Y.: Chemica Scripta, 14, 23 (19781979);Google Scholar
17a Hashimoto, H., Takai, Y., Yokota, Y., Endo, H. and Fukada, E., Japan. J.Applied Phys., 19, L1 (1980).Google Scholar
18. Yoshida, H.: Proc. Int.Conf.Solod-Solid Phase Transf. (AIME, 1983),p.363.Google Scholar
19. Yoshida, H., Hashimoto, H., Yokota, Y. and Ajika, N., Trans.JIM, 6, 378 (1983)Google Scholar
20. Murakami, Y., Yoshida, H. and Yamamoto, S., Trans. JIM, 9, 11 (1968);Google Scholar
20a Yoshida, H., Yamamoto, S., Murakami, Y. and Kodaka, H., Trans. JIM, 12, 229 (1971)Google Scholar