Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-16T19:31:16.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Complex Fluids Under Confinement and Flow: Development of Bragg-Fresnel Optics for X-ray Microdiffraction

Published online by Cambridge University Press:  10 February 2011

Youli Li ,
Stefan H.J. Idziak ,
Ernie Caine ,
G. Subramanian ,
Evelyn Hu  and
Cyrus R. Safinya
Youli Li
Affiliation:
Materials Research Laboratory, Materials Department, Physics Department, Biochemistry and Molecular Biology Program, University of California, Santa Barbara, CA
Stefan H.J. Idziak*
Affiliation:
Materials Research Laboratory, Materials Department, Physics Department, Biochemistry and Molecular Biology Program, University of California, Santa Barbara, CA
Ernie Caine
Affiliation:
Center for Quantized Electronic Structures (QUEST) and Nanotech, UCSB branch of the National Nanofabrication Users Network (NNUN), UCSB, Santa Barbara, CA
G. Subramanian
Affiliation:
Materials Research Laboratory, Materials Department, Physics Department, Biochemistry and Molecular Biology Program, University of California, Santa Barbara, CA
Evelyn Hu
Affiliation:
Center for Quantized Electronic Structures (QUEST) and Nanotech, UCSB branch of the National Nanofabrication Users Network (NNUN), UCSB, Santa Barbara, CA
Cyrus R. Safinya
Affiliation:
Materials Research Laboratory, Materials Department, Physics Department, Biochemistry and Molecular Biology Program, University of California, Santa Barbara, CA
*
2 Current address: Department of Physics, University of Waterloo, Waterloo, Ontario, CANADA
Get access

Abstract

We present results of simultaneous efforts to develop: 1.) Bragg-Fresnel Optics(BFO) to be used in X-ray microdiffraction methods, in particular as applied to structural studies of complex fluids and biomaterials under confinement and flow conditions; and 2.) Methodologies for confining complex fluids and biomaterials for in-situ structural studies. Using microelectronics process technology, we have fabricated linear and circular Bragg-Fresnel Lenses (BFL) in Si and III-V compound semiconductor substrates such as InP, GaAs and GaAs heterostructures with outermost zone width to 0.25 μm. X-ray characterization of linear BFLs were performed on a wiggler beamline at Stanford Synchrotron Radiation Laboratory (SSRL) at x-ray energies of 8 keV and 16 keV. A ∼5 μm focal spot size was obtained with a 50 μm incident beam, which was determined by the partial coherence of the source. On the confinement techniques, we have developed the X-ray Surface Force Apparatus (XSFA) which allows in-situ x-ray diffraction measurements to be made on fluid thin films confined between two atomically smooth surfaces. A new approach is being pursued to study the effects of confinement and flow on complex fluids and biological materials using microchannels fabricated on glass substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 464: Symposium FF – Dynamics in Small Confining Systems III , 1996 , 301
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Snigirev, A.A., Rev. Sci. Instrum. 66(2), 2053–2058, 1995 Google Scholar
2. Snigirev, A., Kohn, V., in X-ray Microbeam Tech. and Appl., Proc. of SPIE, 2516, 27–37, 1995 Google Scholar
3. Snigirev, A., Kohn, V., Snigireva, I. & Lengeler, B., Nature, 384, 49–51, 1996 Google Scholar
4. Caine, E.J., Shi, S., Hu, E.L., Li, Y., Idziak, S.H.J., Subramanian, G., Safinya, C.R., to appear in Microelectronics Engineering Google Scholar
5. Idziak, S.H.J., Safinya, C.R., Hill, R.S., et al., Science, 264, 1915–1918, 1994 Google Scholar
6. Idziak, S.H.J., Koltover, I., Israelavhivilli, J. and Safinya, C.R., Phys. Rev. Lett. 76, 1477–1479, 1996 Google Scholar
7. Koltover, I., Idziak, S.H.J., Davidson, P., Li, Y., Safinya, C.R., et al, J. Phys. II, 6, 893–907, 1996 Google Scholar