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Informatics for Quantitative Analysis of Atom Probe Tomography Images

Published online by Cambridge University Press:  31 January 2011

Santosh K Suram  and
Krishna Rajan
Santosh K Suram
Affiliation:
krajan@iastate.edu, Iowa State University, Materials Science and Engineering, AMES, Iowa, United States
Krishna Rajan
Affiliation:
sksuram@iastate.edu, Iowa State University, Materials Science and Engineering, AMES, Iowa, United States
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Abstract

An informatics based approach to extract further refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) has been developed. The data mining based methods to generate and interpret spectra that de-convolute the SDMs are discussed. This work has resulted in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies is also discussed.

Keywords

crystallographic structurefield emissionW

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References

1 Miller, M. K. and Hetherington, M. G., Surface Science 246 (1-3), 442–449 (1991). Google Scholar
2 Vurpillot, F., Bostel, A., Menand, A. and Blavette, D., Eur. Phys. J. AP 6, 217–221 (1999).Google Scholar
3 Vurpillot, F., Renaud, L. and Blavette, D., Ultramicroscopy 95, 223–229 (2003).Google Scholar
4 Vurpillot, F., Geuser, F. De, Costa, G. Da and Blavette, D., Journal of Microscopy 216 (3), 234–240 (2004).Google Scholar
5 Cerezo, A., Abraham, M., Lane, H., Larson, D.J., Thuvander, M., Seto, K., Warren, P.J. and Smith, G.D.W., “Three Three-dimensional atomic scale analysis of interfaces interfaces,” Electron Microscopy and Analysis, Institute of Phys. Conf. Ser. 161, 29–34 (1999).Google Scholar
6 Geiser, B.P., Kelly, T.F., Larson, D.J., Schneir, J. and Roberts, J.P., Microscopy and Microanalysis, 13, 437–447 (2007).Google Scholar
7 Moody, M.P., Gault, B., Stephenson, L.T., Haley, D. and Ringer, S. P., Ultramicroscopy, 109, 815–824 (2009).Google Scholar
8 Miller, M.K., Atom Probe Tomography: analysis at the atomic level. (Kluwer Academic/Plenum Publishers, New York, 2000) p. 28.Google Scholar
9 Golub, G.H., Loan, C.F. Van, Matrix computations computations, 3rd ed. (John Hopkins Univ. Press, Baltimore, 1996) p. 448. Google Scholar
10 Miranda, A. A., Borgne, Y. A. Le, and Bontempi, G., Neural Processing Letters, 27 (3), 197–207 (2008).Google Scholar
11 Gault, B., Moody, M.P., Geuser, F. De, Fontaine, A. La, Stephenson, L.T., Haley, D. and Ringer, S.P., Microscopy and Microanalysis, 16, 99–110 (2010).Google Scholar