Hostname: page-component-cb9f654ff-mnl9s Total loading time: 0 Render date: 2025-08-24T22:20:14.735Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Measurement of Bending Strength of TiC Whiskers in the Scanning Electron Microscope

Published online by Cambridge University Press:  15 February 2011

Yutaka Seino ,
Shoichiro Shin  and
Satoshi Nagai
Yutaka Seino
Affiliation:
National Research Laboratory of Metrology, 1–4 Umezono 1–chome, Tsukuba, Ibaraki 305, Japan
Shoichiro Shin
Affiliation:
National Research Laboratory of Metrology, 1–4 Umezono 1–chome, Tsukuba, Ibaraki 305, Japan
Satoshi Nagai
Affiliation:
National Research Laboratory of Metrology, 1–4 Umezono 1–chome, Tsukuba, Ibaraki 305, Japan
Get access

Abstract

The three–point bending strength of TiC whiskers was measured in a scanning electron microscope. The whisker samples have ∼ 50µm length and 2∼4µm diameter and are commercially available as reinforcements for composite materials. The distribution of the bending strengths of the whiskers showed a double peak around 5.2GPa and 30.4GPa, respectively. The difference in these values is attributed to differences in the cleavage strength of two crystal planes depending on whisker growth direction.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1 Brenner, S. S., J. Appl. Phys. 27, 1484(1956).Google Scholar
2 Brenner, S. S., ibid. 28, 1023(1957).Google Scholar
3 Marsh, D. M., J. Sci. Instrum. 36, 165(1959).Google Scholar
4 Lemkey, F. D. and Kraft, R. W., Rev. Sci. Instrum. 33(8), 846(1962).Google Scholar
5 Kelsey, R. H. and Krock, R. H., Rev. Sci. Instrum. 36(7), 1031(1965).Google Scholar
6 Kobayashi, H. and Hiki, Y., Jpn. J. Appl. Phys. 11(5), 738(1972).Google Scholar
7 Petrovic, J. J., Milewski, J. V., Rohr, D. L. and Gac, F. D., J. Mater. Sci. 20, 1167(1985).Google Scholar
8 Petrovic, J. J. and Hoover, R. C., J. Mater. Sci. 22, 517(1987).Google Scholar
9 Seino, y., Hida, N. and Nagai, S., J. Mater. Sci. Lett. 11, 515(1992)Google Scholar
10 Macmillan, N. H. and Kelly, A., Proc. Roy. Soc. London A 330, 291(1972).Google Scholar
11 Orowan, E., Rep. Prog. Phys. 12, 185(1949).Google Scholar