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Ion-Projection Lithography for Submicron Modification of Materials

Published online by Cambridge University Press:  25 February 2011

G. Stengl
Affiliation:
FETEC, A 1070 Vienna, Austria
H. LÖSchner
Affiliation:
FETEC, A 1070 Vienna, Austria
W. Maurer
Affiliation:
FETEC, A 1070 Vienna, Austria
P. Wolf
Affiliation:
FETEC, A 1070 Vienna, Austria
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Abstract

Ion-Projection Lithography (IPL) is a future production technique for submicron electronic devices, wich combines the advantages of e-beam and X-ray lithography without having their disadvantages. Like electrons, ions can be accelerated, focused and deflected, and as is the case with X-rays, scattering in resist layers is less pronounced as for e-beams. Experimental results of IPL obtained with an Ion-Projection-Lithography-Machine IPLM-01 are presented: Ion images of self supporting masks ten times demagnified with a geometrical resolution < 0.25 μm printed into organic and inorganic resist layers in high volume production oriented times.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Muray, J.J., Semicond. International 7/4, 130, (1984).Google Scholar
2. Brown, W.L., 1984 Internat. Symposion Electron, Ion, Photon Beams,TorrytownGoogle Scholar
3. Namba, S., Ion Beam Microfabrication, Int. Ion Eng. Congr., Kyoto 1983 Google Scholar
4. Brown, W.L., Venkatesan, T., Wagner, A., Solid State Techn. 24/8, 60, (1981).Google Scholar
5. Wagner, A, Solid State Techn. 26/5, 97, (1083).Google Scholar