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Laser-Pulse Melting of Hafnium-Implanted Nickel Studied with Tdpac and Rbs/Channeling Techniques

Published online by Cambridge University Press:  15 February 2011

L. Buene ,
E. N. Kaufmann ,
M. L. Mcdonald ,
J. Kothaus ,
R. Vianden ,
K. Freitag  and
C. W. Draper
L. Buene
Affiliation:
Bell Laboratories, Murray Hill, New Jersey 07974
E. N. Kaufmann
Affiliation:
Bell Laboratories, Murray Hill, New Jersey 07974
M. L. Mcdonald
Affiliation:
Bell Laboratories, Murray Hill, New Jersey 07974
J. Kothaus
Affiliation:
Institut für Strahlen-und Kernphysik, University of Bonn, West Germany
R. Vianden
Affiliation:
Institut für Strahlen-und Kernphysik, University of Bonn, West Germany
K. Freitag
Affiliation:
Institut für Strahlen-und Kernphysik, University of Bonn, West Germany
C. W. Draper
Affiliation:
Western Electric Engineering Research Center, Princeton, New Jersey 08540
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Abstract

The perturbed angular correlation technique has been applied to study the local environment of tantalum in nickel after ion implantation of hafnium and after laser-pulse melting. The magnetic hyperfine interaction at the daughter nucleus tantalum in nickel is used to determine the uniqueness of the tantalum lattice site. Several hafnium concentrations were employed and auxiliary measurements using ion-beam channeling, Rutherford backscattering and Auger electron spectroscopy were performed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 3: Symposium – Nuclear and Electron Resonance Spectroscopies Applied to Materials Science , 1980 , 391
Copyright
Copyright © Materials Research Society 1981

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References

REFERENCES

1. Buene, L., Poate, J. M., Jacobson, D. C., Draper, C. W. and Hirvonen, J. K., Appl. Phys. Letters, 385 (1980) andGoogle Scholar
in Mat. Res. Soc. Proceedings (1980) 1, in press.Google Scholar
2. Moffatt, W. G., The Handbook of Binary Phase Diagrams (General Electric Co., Schenectady, 1978) (12/79 update).Google Scholar
3. Kaufmann, E. N., Poate, J. M. and Augustyniak, W. M., Phys. Rev. B7, 951 (1973).CrossRefGoogle Scholar
4. Gerdau, E., Winkler, H., Gebert, W., Giese, B. and Braunsfurth, J., Hyperfine Interact. 1, 459 (1976):Google Scholar
Gerdau, E., Winkler, H., Giese, B. and Braunsfurth, J., Hyperfine Interact. 1, 469 (1976).Google Scholar
5. Kaufmann, E. N., this volume (Figure 10).Google Scholar
6. Metev, S. M. et al. , J. Phys. D13, L75 (1980).Google Scholar
7. Kothaus, J. et al. , to be published.Google Scholar