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Local Optical Probes of Microwave Dielectric Dispersion in Ferroelectric Thin Films

  • Charles Hubert (a1), Jeremy Levy (a1), E. J. Cukauskas (a2), Steven W. Kirchoefer (a2), Jeffrey M. Pond (a2) and William J. DeSisto (a2)...

The soft-mode contribution to the dielectric response of Ba0.5Sr0.5TiO3 ferroelectric thin films is measured locally at microwave frequencies using time-resolved confocal scanning optical microscopy. Optical measurements performed on an ensemble of nanometer-scale regions show a well-defined phase shift between the paraelectric and ferroelectric response at 2-4 GHz. Application of a static electric field produces large local variations in the phase of the ferroelectric response. These variations are attributed to the growth of a-axis ferroelectric nanodomains whose size-dependent relaxation frequencies lead to strong dielectric dispersion at mesoscopic scales. The in-plane paraelectric response is believed to arise from the surrounding c-axis matrix and non-polar regions, and shows negligible dispersion. These results provide a direct view of the soft-mode mechanisms of microwave dielectric loss in ferroelectric thin films.

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