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Mechanical and Structural Properties of Ion Implanted Yttria Stabiizeed Zirconia Ceramics

Published online by Cambridge University Press:  21 February 2011

J. K. Cochran ,
K. O. Legg  and
H. F. Solnick-Legg
J. K. Cochran
Affiliation:
Georgia Institute of Technology, Atlanta, GA 30332
K. O. Legg
Affiliation:
Georgia Institute of Technology, Atlanta, GA 30332 Ion Technology, Inc., P.O. Box 7465, Atlanta, GA 30357
H. F. Solnick-Legg
Affiliation:
Ion Technology, Inc., P.O. Box 7465, Atlanta, GA 30357
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Abstract

Single crystal yttria stabilized zirconia was implanted with 100 keV Ca+, Al+, and O2+ ions at fluences of 1015 to 6 × 1016 ions/cm2; . Blistering was observed at doses of 3 × 1016; O2;+ cm−2; and 6 × 1016; Al+ cm−2; but none was evident with Ca+. Knoop microhardness with a shallow indenter penetration depth peaked at a dose of 1016; ions/cm−2; for both Al+ and O2;+ but Ca+ produced no effect on microhardness. Vicker's microhardness with a much greater indenter penetration depth was not changed detectably by implantation but fracture toughness measurements from the same Vicker's indentations exhibited 10–23% increases at the highest O2+ doses and 20–25% increases at high Al+ doses. Annealing the highest implant doses at 1200° reduced the fracture toughness to pre-implant levels. Reflection electron diffraction showed that the surface had not been made amorphous by the 6 × 1016; Al+ dose as a well crystallized diffraction pattern was obtained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 24: Symposium B – Defect Properties and Processing of High-Technology Nonmetallic Materials , 1983 , 173
Copyright
Copyright © Materials Research Society 1984

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References

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