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Mechanoluminescence Studies upon Single Nanoparticles by AFM-photomeasurement System

Published online by Cambridge University Press:  01 February 2011

Nao Terasaki
Affiliation:
nao-terasaki@aist.go.jp, National Institute of Advanced Industrial Science and Technology, On-Site Sensing and Diagnosis Research Laboratory, 807-1 Shuku-machi, Tosu, 841-0052, Japan, +81-942-81-4038, +81-942-81-3690
Kazufumi Sakai
Affiliation:
kazufumi-sakai@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), On-Site Sensing and Diagnosis Research Laboratory, Tosu, 841-0052, Japan
Toshiaki Koga
Affiliation:
t-koga@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Chengzhou Li
Affiliation:
nao-terasaki@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Yusuke Imai
Affiliation:
y-imai@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Hiroshi Yamada
Affiliation:
hiro-yamada@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Yoshio Adachi
Affiliation:
y-adachi@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Keiko Nishikubo
Affiliation:
nishikubo-k@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
Chao-Nan Xu
Affiliation:
cn-xu@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, 841-0052, Japan
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Abstract

We successfully measured the mechanoluminesence (ML) from a single ML nanoparticle at the first time. In order to measure the weak light emission from a single nanoparticle induced by applying a micro force, we developed an AFM-based new apparatus with a photomultiplier. Interestingly, the emission (ML) intensity from a nanoparticle was approximately proportional to the load, the phenomena is similar to the macroscopic ML emission properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Xu, C. N., Watanabe, T., Akiyama, M. and Zheng, X. G., Appl. Phys. Lett. 74, 2414(1999).Google Scholar
2. Xu, C. N., Zheng, X. G., Watanabe, T., Akiyama, M. and Usui, I., Thin Solid Films 352, 273 (1999).Google Scholar
3. Xu, C. N., Watanabe, T., Akiyama, M. and Zheng, X. G., Appl. Phys. Lett. 74, 1236 (1999).Google Scholar
4. Xu, C. N., Zheng, X. G., Akiyama, M., Nonaka, K. and Watanabe, T., Appl. Phys. Lett. 76, 176 (2000).Google Scholar
5. Matsui, H., Xu, C. N. and Tateyama, H., Appl. Phys. Lett. 78, 1068 (2001).Google Scholar
6. Xu, C. N., Encyclopedia of Smart Mterials, 1–2, 190 (2002).Google Scholar
7. Liu, Y. and Xu, C. N., J. Phys. Chem. B 107, 3991 (2003).Google Scholar
8. Xu, C.N., Li, C., Imai, Y., Yamada, H., Adachi, Y. and Nishikubo, K., proceedings of 11th International Conferences on Modern Materials and Technologies (2006).Google Scholar
9. Sakai, K., Koga, T., Imai, Y., Maehara, S. and Xu, C. N., Phys. Chem. Chem. Phys. 8, 2819 (2006).Google Scholar